Microstructural evolution of [PbZrxTi1-xO3/PbZryTi1-yO3](n) epitaxial multilayers (x/y=0.2/0.4, 0.4/0.6) - dependence on layer thickness

doi:10.1080/14786430903352656

IMR OpenIR

	Microstructural evolution of [PbZrxTi1-xO3/PbZryTi1-yO3](n) epitaxial multilayers (x/y=0.2/0.4, 0.4/0.6) - dependence on layer thickness
	Zhu, Y. L.1; Zheng, S. J.1; Ma, X. L.1; Feigl, L.2; Alexe, M.2; Hesse, D.2; Vrejoiu, I.2
通讯作者	Zhu, Y. L.(ylzhu@imr.ac.cn)
	2010
发表期刊	PHILOSOPHICAL MAGAZINE
ISSN	1478-6435
卷号	90 期号:10 页码:1359-1372
摘要	The microstructure of ferroelectric [PbZrxTi1-xO3/PbZryTi1-yO3](n) epitaxial multilayers (x/y 0.2/0.4, 0.4/0.6) deposited on SrRuO3-coated SrTiO3 substrates by pulsed-laser deposition with different layer periodicity and layer thickness was characterized by means of transmission electron microscopy. Electron diffraction and contrast analysis revealed a very clear and well-separated layer sequence. The microstructures of PbZr0.2Ti0.8O3/PbZr0.4Ti0.6O3 and PbZr0.4Ti0.6O3/PbZr0.6Ti0.4O3 multilayers show a similar tendency in the dependence on the individual layer thickness. Whereas with thick individual layers, tetragonal a-domains are confined to specific layers of the two types of multilayers, below a certain critical thickness of the individual layers, a-domains extend over the whole film. This indicates a transition into a uniform tetragonal lattice and strain state of the whole multilayer. Increasing the layer periodicity further, the interfaces in PbZr0.4Ti0.6O3/PbZr0.6Ti0.4O3 multilayers become rough, and complex a-domain configurations appear.
关键词	ferroelectrics transmission electron microscopy microstructure
资助者	National Basic Research Program of China ; National Natural Science Foundation of China ; German Research Foundation (DFG)
DOI	10.1080/14786430903352656
收录类别	SCI
语种	英语
资助项目	National Basic Research Program of China[2009CB623705] ; National Natural Science Foundation of China[50871115] ; German Research Foundation (DFG)[FOR 404] ; German Research Foundation (DFG)[SFB 762]
WOS研究方向	Materials Science ; Mechanics ; Metallurgy & Metallurgical Engineering ; Physics
WOS类目	Materials Science, Multidisciplinary ; Mechanics ; Metallurgy & Metallurgical Engineering ; Physics, Applied ; Physics, Condensed Matter
WOS记录号	WOS:000276638400008
出版者	TAYLOR & FRANCIS LTD
引用统计	被引频次：4[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	http://ir.imr.ac.cn/handle/321006/102416
专题	中国科学院金属研究所
通讯作者	Zhu, Y. L.
作者单位	1.Chinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, Shenyang 110016, Peoples R China 2.Max Planck Inst Microstruct Phys, D-06120 Halle, Germany
推荐引用方式 GB/T 7714	Zhu, Y. L.,Zheng, S. J.,Ma, X. L.,et al. Microstructural evolution of [PbZrxTi1-xO3/PbZryTi1-yO3](n) epitaxial multilayers (x/y=0.2/0.4, 0.4/0.6) - dependence on layer thickness[J]. PHILOSOPHICAL MAGAZINE,2010,90(10):1359-1372.
APA	Zhu, Y. L..,Zheng, S. J..,Ma, X. L..,Feigl, L..,Alexe, M..,...&Vrejoiu, I..(2010).Microstructural evolution of [PbZrxTi1-xO3/PbZryTi1-yO3](n) epitaxial multilayers (x/y=0.2/0.4, 0.4/0.6) - dependence on layer thickness.PHILOSOPHICAL MAGAZINE,90(10),1359-1372.
MLA	Zhu, Y. L.,et al."Microstructural evolution of [PbZrxTi1-xO3/PbZryTi1-yO3](n) epitaxial multilayers (x/y=0.2/0.4, 0.4/0.6) - dependence on layer thickness".PHILOSOPHICAL MAGAZINE 90.10(2010):1359-1372.