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Microstructure and transport properties of sol-gel derived highly (100)-oriented lanthanum nickel oxide thin films on SiO2/Si substrate
Zhu, M. W.; Wang, Z. J.; Chen, Y. N.; Zhang, Z. D.
通讯作者Wang, Z. J.(wangzj@imr.ac.cn)
2011-12-01
发表期刊JOURNAL OF CRYSTAL GROWTH
ISSN0022-0248
卷号336期号:1页码:44-49
摘要In the present work, lanthanum nickel oxide (LNO) thin films were prepared by the sol-gel method and different thermal treatments were adopted by adjusting the preheating treatment. The microstructure, crystal orientation, chemical composition and electrical properties of LNO films were analyzed to elucidate the relationship between the microstructure and the transport properties of the films. The results show that equiaxed grains predominate the microstructure of the films with pyrolysis step. Without the pyrolysis step, columnar grains are formed in the films, accompanied with an improvement in crystallinity and strengthening of the (100)-orientation. Furthermore, the metal-insulator transition temperature decreases for the films without the pyrolysis step. The effect of film microstructure on its electrical properties was discussed in terms of the existence of internal stress and the improved crystallinity. (C) 2011 Elsevier B.V. All rights reserved.
关键词Crystal morphology Pyrolysis step Epitaxial growth Sol-gel Lanthanum nickel oxide Electric materials
资助者Chinese Academy of Sciences ; National Natural Science of Foundation of China ; National Basic Research Program ; Ministry of Science and Technology of China ; Provincial Science of Foundation of Liaoning Province of China ; Research Program of Science and Technology of Shenyang City of China
DOI10.1016/j.jcrysgro.2011.09.050
收录类别SCI
语种英语
资助项目Chinese Academy of Sciences ; National Natural Science of Foundation of China[51072202] ; National Basic Research Program[2010CB934603] ; Ministry of Science and Technology of China ; Provincial Science of Foundation of Liaoning Province of China[20102228] ; Research Program of Science and Technology of Shenyang City of China[P112538]
WOS研究方向Crystallography ; Materials Science ; Physics
WOS类目Crystallography ; Materials Science, Multidisciplinary ; Physics, Applied
WOS记录号WOS:000297834800009
出版者ELSEVIER SCIENCE BV
引用统计
被引频次:9[WOS]   [WOS记录]     [WOS相关记录]
文献类型期刊论文
条目标识符http://ir.imr.ac.cn/handle/321006/105294
专题中国科学院金属研究所
通讯作者Wang, Z. J.
作者单位Chinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, Shenyang 110016, Peoples R China
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GB/T 7714
Zhu, M. W.,Wang, Z. J.,Chen, Y. N.,et al. Microstructure and transport properties of sol-gel derived highly (100)-oriented lanthanum nickel oxide thin films on SiO2/Si substrate[J]. JOURNAL OF CRYSTAL GROWTH,2011,336(1):44-49.
APA Zhu, M. W.,Wang, Z. J.,Chen, Y. N.,&Zhang, Z. D..(2011).Microstructure and transport properties of sol-gel derived highly (100)-oriented lanthanum nickel oxide thin films on SiO2/Si substrate.JOURNAL OF CRYSTAL GROWTH,336(1),44-49.
MLA Zhu, M. W.,et al."Microstructure and transport properties of sol-gel derived highly (100)-oriented lanthanum nickel oxide thin films on SiO2/Si substrate".JOURNAL OF CRYSTAL GROWTH 336.1(2011):44-49.
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