Identification of epsilon '-Fe2N and epsilon '-Fe3N superstructures studied with high-resolution electron microscopy

IMR OpenIR

	Identification of epsilon '-Fe2N and epsilon '-Fe3N superstructures studied with high-resolution electron microscopy
	Liu, ZQ ; Li, DX ; Hei, ZK ; Hashimoto, H
通讯作者	Liu, ZQ()
	2001-08-31
发表期刊	SCRIPTA MATERIALIA
ISSN	1359-6462
卷号	45 期号:4 页码:455-462
摘要	The identification of epsilon ' -Fe2N and epsilon ' -Fe3N nitrides, which have similar crystal structures, was studied according to the dynamical electron diffraction theory and image analysis. The nitrogen sub-lattice images in epsilon ' -Fe2N, which are different from those in epsilon ' -Fe3N, were observed by high-resolution electron microscopy. (C) 2001 Acta Materialia Inc. Published by Elsevier Science Ltd. All rights reserved.
关键词	nitrides crystal structure transmission electron microscopy image analysis
收录类别	SCI
语种	英语
WOS研究方向	Science & Technology - Other Topics ; Materials Science ; Metallurgy & Metallurgical Engineering
WOS类目	Nanoscience & Nanotechnology ; Materials Science, Multidisciplinary ; Metallurgy & Metallurgical Engineering
WOS记录号	WOS:000171306900013
出版者	PERGAMON-ELSEVIER SCIENCE LTD
引用统计	被引频次：19[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	http://ir.imr.ac.cn/handle/321006/112318
专题	中国科学院金属研究所
通讯作者	Liu, ZQ
作者单位	1.Okayama Univ Sci, Dept Mech Engn, Okayama 7000005, Japan 2.Chinese Acad Sci, Met Res Inst, Atom Imaging Solids Lab, Shenyang 110015, Peoples R China 3.Dalian Maritime Univ, Inst Mat & Technol, Dalian 116026, Peoples R China
推荐引用方式 GB/T 7714	Liu, ZQ,Li, DX,Hei, ZK,et al. Identification of epsilon '-Fe2N and epsilon '-Fe3N superstructures studied with high-resolution electron microscopy[J]. SCRIPTA MATERIALIA,2001,45(4):455-462.
APA	Liu, ZQ,Li, DX,Hei, ZK,&Hashimoto, H.(2001).Identification of epsilon '-Fe2N and epsilon '-Fe3N superstructures studied with high-resolution electron microscopy.SCRIPTA MATERIALIA,45(4),455-462.
MLA	Liu, ZQ,et al."Identification of epsilon '-Fe2N and epsilon '-Fe3N superstructures studied with high-resolution electron microscopy".SCRIPTA MATERIALIA 45.4(2001):455-462.