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AN HREM IMAGE-ANALYSIS FOR GEOMETRICAL MISMATCH AT INTERFACES
YE, HQ
Corresponding AuthorYE, HQ()
1995
Source PublicationINTERFACES II
ISSN0255-5476
Volume189-Pages:155-160
AbstractThe normal interface analysis procedure is that to calculate the mismatch between two sets of lattice planes of the two corresponding matrix phases based upon the lattice parameters, then to compare the results with the observed interface dislocation arrangement. This work investigates the cases where misfit dislocations should exist at the interface according to prediction from geometrical analysis, however, very good coherent match at such interface in fact appears in the observed high resolution electron microscopy (HREM) images. The fact implies that the structural similarity between two phases can accommodate a rather large geometrical mismatch at the interface under certain conditions.
KeywordINTERFACE GEOMETRICAL MISMATCH HREM
Indexed BySCI
Language英语
WOS Research AreaMaterials Science ; Polymer Science
WOS SubjectMaterials Science, Ceramics ; Materials Science, Multidisciplinary ; Materials Science, Characterization & Testing ; Materials Science, Coatings & Films ; Materials Science, Composites ; Polymer Science
WOS IDWOS:A1995BE01S00016
PublisherTRANS TECH PUBLICATIONS LTD
Citation statistics
Document Type期刊论文
Identifierhttp://ir.imr.ac.cn/handle/321006/126493
Collection中国科学院金属研究所
Corresponding AuthorYE, HQ
AffiliationCHINESE ACAD SCI,INST MET RES,ATOM IMAGING SOLIDS LAB,SHENYANG 110015,PEOPLES R CHINA
Recommended Citation
GB/T 7714
YE, HQ. AN HREM IMAGE-ANALYSIS FOR GEOMETRICAL MISMATCH AT INTERFACES[J]. INTERFACES II,1995,189-:155-160.
APA YE, HQ.(1995).AN HREM IMAGE-ANALYSIS FOR GEOMETRICAL MISMATCH AT INTERFACES.INTERFACES II,189-,155-160.
MLA YE, HQ."AN HREM IMAGE-ANALYSIS FOR GEOMETRICAL MISMATCH AT INTERFACES".INTERFACES II 189-(1995):155-160.
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