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Dynamic response and hysteresis dispersion scaling of ferroelectric SrBi2Ta2O9 thin films
Pan, B; Yu, H; Wu, D; Zhou, XH; Liu, JM
Corresponding AuthorLiu, JM()
2003-08-18
Source PublicationAPPLIED PHYSICS LETTERS
ISSN0003-6951
Volume83Issue:7Pages:1406-1408
AbstractThe dynamic hysteresis response of ferroelectric SrBi2Ta2O9 thin films versus periodically varying electric field over a frequency range of f=10(-1)-10(6) Hz and amplitude range of E-0=15-158 kV/cm is measured utilizing the Sawyer-Tower method. The dynamic order parameter Q shows anomalous behavior against the field amplitude, and a single-peaked hysteresis dispersion is identified. The field response of hysteresis area in the form of proportional tof(2/3)E(0)(2/3) over the low frequency range is evaluated, while the response over the high frequency range takes the form of proportional tof(-1/3)E(0)(2). We demonstrate that the hysteresis dispersion spectrum exhibits single-parameter scaling, and predicts a characteristic time for domain reversal that is inversely correlated to the field amplitude. (C) 2003 American Institute of Physics.
DOI10.1063/1.1602580
Indexed BySCI
Language英语
WOS Research AreaPhysics
WOS SubjectPhysics, Applied
WOS IDWOS:000184748600042
PublisherAMER INST PHYSICS
Citation statistics
Cited Times:60[WOS]   [WOS Record]     [Related Records in WOS]
Document Type期刊论文
Identifierhttp://ir.imr.ac.cn/handle/321006/126942
Collection中国科学院金属研究所
Corresponding AuthorLiu, JM
Affiliation1.Nanjing Univ, Solid State Microstruct Lab, Nanjing 210093, Peoples R China
2.Chinese Acad Sci, Ctr Phys Mat, Shenyang, Peoples R China
Recommended Citation
GB/T 7714
Pan, B,Yu, H,Wu, D,et al. Dynamic response and hysteresis dispersion scaling of ferroelectric SrBi2Ta2O9 thin films[J]. APPLIED PHYSICS LETTERS,2003,83(7):1406-1408.
APA Pan, B,Yu, H,Wu, D,Zhou, XH,&Liu, JM.(2003).Dynamic response and hysteresis dispersion scaling of ferroelectric SrBi2Ta2O9 thin films.APPLIED PHYSICS LETTERS,83(7),1406-1408.
MLA Pan, B,et al."Dynamic response and hysteresis dispersion scaling of ferroelectric SrBi2Ta2O9 thin films".APPLIED PHYSICS LETTERS 83.7(2003):1406-1408.
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