| FeCr15Ni15单晶600℃下热生长氧化膜的TEM观察 | |
| Alternative Title | TEM Investigation to Oxide Scale Formed on Single Crystal Alloy FeCr15Ni15 at High Temperature |
| 魏欣欣1; 张波1; 马秀良1 | |
| 2019 | |
| Source Publication | 中国腐蚀与防护学报
 |
| ISSN | 1005-4537 |
| Volume | 39.0Issue:005Pages:417-422 |
| Abstract | 利用透射电子显微镜(TEM)对FeCr15Ni15单晶在600℃下形成的氧化膜进行了系统的研究。结果表明,氧化膜分为内外两层,膜厚为4~6μm。膜内层为富Fe、Cr的尖晶石氧化物,膜外层为富Fe、Ni的尖晶石氧化物。氧化膜内层具有晶体学面的各向异性,氧化膜沿着富Ni基体大量的(111)面外延生长,110基体//110氧化膜,(111)基体//(111)氧化膜。内层氧化膜的外侧区域较内侧区域氧化更充分,存在大量的面缺陷和Kirkendall效应留下的空洞,成为膜最疏松的区域。外层尖晶石氧化膜较为致密。 |
| Other Abstract | The oxide scale formed on FeCr15Ni15 single crystal alloy at 600℃for 20 h was characterized by means of transmission electron microscope.Results showed that the oxide scale of 4~6μm in thickness was differentiated into two layers.The inner layer of the scale was spinel oxide rich in Fe and Cr,while the outer layer was spinel oxide rich in Fe and Ni.The region I of inner layer was anisotropy,of which oxides present epitaxial growth along a large amount of(111)plane of the matrix,i.e.110matrix//110ox,(111)matrix//(111)ox,however the region II and region III compose completely of oxides,while there exist a large number of surface defects and holes left by the kirkendall effect,which become the most porous area of the oxide scale,therefore,as a result,cracking and spalling off may certainly occur there.In the contrast,the outer layer of the oxide scale is dense one composed of polycrystalline spinel oxides. |
| Keyword | 氧化膜 TEM FeCr15Ni15单晶 微观结构 |
| Indexed By | CSCD |
| Language | 中文 |
| CSCD ID | CSCD:6594182 |
| Citation statistics | |
| Document Type | 期刊论文 |
| Identifier | http://ir.imr.ac.cn/handle/321006/145686 |
| Collection | 中国科学院金属研究所 |
| Affiliation | 1.中国科学院金属研究所 2.中国科学技术大学 |
| Recommended Citation GB/T 7714 | 魏欣欣,张波,马秀良. FeCr15Ni15单晶600℃下热生长氧化膜的TEM观察[J]. 中国腐蚀与防护学报,2019,39.0(005):417-422. |
| APA | 魏欣欣,张波,&马秀良.(2019).FeCr15Ni15单晶600℃下热生长氧化膜的TEM观察.中国腐蚀与防护学报,39.0(005),417-422. |
| MLA | 魏欣欣,et al."FeCr15Ni15单晶600℃下热生长氧化膜的TEM观察".中国腐蚀与防护学报 39.0.005(2019):417-422. |
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