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X-ray photoelectron spectroscopy analysis of the effect of thickness on the transformation temperature of NiTi alloy thin films
Alternative TitleX-ray photoelectron spectroscopy analysis of the effect of thickness on the transformation temperature of NiTi alloy thin films
Li YongHua1; Meng FanLing1; Liu ChangSheng3; Zheng WeiTao2; Wang YuMing2
2009
Source PublicationACTA PHYSICA SINICA
ISSN1000-3290
Volume58Issue:4Pages:2742-2745
AbstractThe effect of thickness on transformation temperuture of the NiTi thin films has been studied by X-ray diffraction and X-ray photoelectron spectroscopy. Results show that the crystallization temperature for 3 mu m-thick film is higher than that for 18 mu m thick film at the same growth temperature and post annealing. With the substrate temperature increasing, the start temperature (A(s)) of austenite phase is lowered after annealing at 763 K for 1 h. There is an oxide layer (TiO2) on the film surface, which prevents the Ni atom from coming onto the surface. There is an oxide layer of a mixture Ti2O3 with NiO on the film /substrate interface. The oxide layers affect the transformation temperature by changing the Ni atomic content in the interior of the film.
KeywordMARTENSITIC-TRANSFORMATION OXIDATION BEHAVIOR PHASE NiTi alloy film X-ray diffraction phase transformation X-ray photoelectron spectroscopy
Indexed ByCSCD
Language英语
Funding Project[Harbin Engineering University, China] ; [National Science Foundation for Post-doctoral Scientists of China] ; [Post-doctoral Sustentation Fund of Heilongjiang Province, China]
CSCD IDCSCD:3540652
Citation statistics
Cited Times:1[CSCD]   [CSCD Record]
Document Type期刊论文
Identifierhttp://ir.imr.ac.cn/handle/321006/147240
Collection中国科学院金属研究所
Affiliation1.Harbin Engn University, Sch Sci, Natl Key Lab Technol AUVs, Harbin 150001, Peoples R China
2.中山大学
3.中国科学院金属研究所
Recommended Citation
GB/T 7714
Li YongHua,Meng FanLing,Liu ChangSheng,et al. X-ray photoelectron spectroscopy analysis of the effect of thickness on the transformation temperature of NiTi alloy thin films[J]. ACTA PHYSICA SINICA,2009,58(4):2742-2745.
APA Li YongHua,Meng FanLing,Liu ChangSheng,Zheng WeiTao,&Wang YuMing.(2009).X-ray photoelectron spectroscopy analysis of the effect of thickness on the transformation temperature of NiTi alloy thin films.ACTA PHYSICA SINICA,58(4),2742-2745.
MLA Li YongHua,et al."X-ray photoelectron spectroscopy analysis of the effect of thickness on the transformation temperature of NiTi alloy thin films".ACTA PHYSICA SINICA 58.4(2009):2742-2745.
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