| PbTiO3/SrTiO3(001)复杂畴组态和缺陷的研究 | |
| Alternative Title | Study of complex domain configuration and lattice defects in PbTiO3/SrTiO3(001)thin films |
| 冯燕朋1; 朱银莲1; 唐云龙1; 马秀良1 | |
| 2018 | |
| Source Publication | 电子显微学报
 |
| ISSN | 1000-6281 |
| Volume | 37.0Issue:006Pages:556-562 |
| Abstract | 用透射电子显微镜对PbTiO3/SrTiO3(001)薄膜内部所形成的复杂畴组态以及畴壁处的位错进行了系统的研究。透射电镜结果和几何相位分析(GPA)表明,薄膜内部两个交叉的a畴内部出现了180°畴壁,导致在局部区域形成了全闭合畴结构,在铁电畴壁处观察到高密度位错。高分辨HAADF-STEM像分析显示,在90°畴壁处容易形成a 型位错,在180°畴壁处容易形成a 型位错,表明位错的形成与铁电畴壁类型存在强耦合关系。 |
| Other Abstract | The complex domain configuration and lattice defects at domain walls in ferroelectric PbTiO 3 thin films grown on SrTiO 3(001)substrates were investigated by transmission electron microscopy(TEM).TEM results and geometry phase analysis(GPA)show that the 180°domain wall forms at the intersections of a domains and further generates flux-closure domain structures.Atomic-scale HAADF-STEM images reveal high density dislocations at ferroelectric domain walls,which have Burgers vectors of a and a ,respectively.The a dislocations are mainly located around 90°domain walls,while the a dislocations are mainly around 180°domain walls. |
| Keyword | 铁电薄膜 畴组态 铁电畴壁 晶格缺陷 |
| Indexed By | CSCD |
| Language | 中文 |
| CSCD ID | CSCD:6399439 |
| Citation statistics |
Cited Times:6[CSCD]
[CSCD Record]
|
| Document Type | 期刊论文 |
| Identifier | http://ir.imr.ac.cn/handle/321006/147739 |
| Collection | 中国科学院金属研究所 |
| Affiliation | 1.中国科学院金属研究所 2.中国科学院 3.兰州理工大学 |
| Recommended Citation GB/T 7714 | 冯燕朋,朱银莲,唐云龙,等. PbTiO3/SrTiO3(001)复杂畴组态和缺陷的研究[J]. 电子显微学报,2018,37.0(006):556-562. |
| APA | 冯燕朋,朱银莲,唐云龙,&马秀良.(2018).PbTiO3/SrTiO3(001)复杂畴组态和缺陷的研究.电子显微学报,37.0(006),556-562. |
| MLA | 冯燕朋,et al."PbTiO3/SrTiO3(001)复杂畴组态和缺陷的研究".电子显微学报 37.0.006(2018):556-562. |
| Files in This Item: | There are no files associated with this item. | |||||
Items in the repository are protected by copyright, with all rights reserved, unless otherwise indicated.
Edit Comment