IMR OpenIR
低辐射薄膜TiO2—Ag—TiO2—SiO的纳米尺度显微结构
詹倩; 于荣; 贺连龙; 李斗星; 郭晓楠
2001
Source Publication金属学报
ISSN0412-1961
Volume37.0Issue:004Pages:337-339
Abstract成功地制务了TiO2-Ag-TiO2-SiO超薄多层膜的截面样品,并对其微观结构进行TEM,HREM及纳米束EDS分析,结果表明,薄膜各层厚度均匀,界面明锐、光滑。Ag层由纳米晶组成,而TiO2和SiO层为非晶。Ag在膜层中没有扩散或聚团,这也正是保证整个薄膜性能指标的一一个重要因素。
Keyword低辐射薄膜 微观结构 HREM 纳米束分析
Indexed ByCSCD
Language中文
CSCD IDCSCD:675805
Citation statistics
Document Type期刊论文
Identifierhttp://ir.imr.ac.cn/handle/321006/151342
Collection中国科学院金属研究所
Affiliation中国科学院金属研究所
Recommended Citation
GB/T 7714
詹倩,于荣,贺连龙,等. 低辐射薄膜TiO2—Ag—TiO2—SiO的纳米尺度显微结构[J]. 金属学报,2001,37.0(004):337-339.
APA 詹倩,于荣,贺连龙,李斗星,&郭晓楠.(2001).低辐射薄膜TiO2—Ag—TiO2—SiO的纳米尺度显微结构.金属学报,37.0(004),337-339.
MLA 詹倩,et al."低辐射薄膜TiO2—Ag—TiO2—SiO的纳米尺度显微结构".金属学报 37.0.004(2001):337-339.
Files in This Item:
There are no files associated with this item.
Related Services
Recommend this item
Bookmark
Usage statistics
Export to Endnote
Google Scholar
Similar articles in Google Scholar
[詹倩]'s Articles
[于荣]'s Articles
[贺连龙]'s Articles
Baidu academic
Similar articles in Baidu academic
[詹倩]'s Articles
[于荣]'s Articles
[贺连龙]'s Articles
Bing Scholar
Similar articles in Bing Scholar
[詹倩]'s Articles
[于荣]'s Articles
[贺连龙]'s Articles
Terms of Use
No data!
Social Bookmark/Share
All comments (0)
No comment.
 

Items in the repository are protected by copyright, with all rights reserved, unless otherwise indicated.