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Cr2Ta中层错的Z衬度像研究
Alternative TitleZ-contrast imaging investigation of stacking faults in Cr2Ta Laves phase
吴元元; 朱银莲; 叶恒强
2007
Source Publication电子显微学报
ISSN1000-6281
Volume26.0Issue:005Pages:419-422
Abstract本文利用高角环形暗场成像技术获得六角Cr2Ta Laves相的重原子分辨的原子序数(Z)衬度像,阐述了在相近分辨率情况下Z衬度成像技术与普通高分辨像相比具有一定优势。从所得到Cr2Ta的层错的Z衬度像,直观地解释了层错的原子排列构型,为理解复杂结构中缺陷的原子构型提供了资料。
Other Abstract Atomic projection of hexagonal Cr_2Ta Laves phase has been directly imaged by Z-contrast imaging at an atomic scale,which provides much more detailed information compared with the conventional coherent high-resolution imaging.Stacking faults with sequence of …stst'st'stst'… were identified,where the three-layer stacks(Ta-Cr-Ta)switch from t to t' type.The defect configuration at an atomic level in the present study is expected to provide useful information for understanding defect structures in the Laves phase.
KeywordCr2Ta Z衬度像 层错 高分辨像
Indexed ByCSCD
Language中文
CSCD IDCSCD:2929143
Citation statistics
Cited Times:1[CSCD]   [CSCD Record]
Document Type期刊论文
Identifierhttp://ir.imr.ac.cn/handle/321006/153542
Collection中国科学院金属研究所
Affiliation中国科学院金属研究所
Recommended Citation
GB/T 7714
吴元元,朱银莲,叶恒强. Cr2Ta中层错的Z衬度像研究[J]. 电子显微学报,2007,26.0(005):419-422.
APA 吴元元,朱银莲,&叶恒强.(2007).Cr2Ta中层错的Z衬度像研究.电子显微学报,26.0(005),419-422.
MLA 吴元元,et al."Cr2Ta中层错的Z衬度像研究".电子显微学报 26.0.005(2007):419-422.
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