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Laves相Cr2 Nb中棱锥面层错结构的像差矫正电子显微学分析
Alternative TitleAberration-corrected high-resolution transmission electron microscopy investigation of stacking faults on pyramidal planes in C14 Laves phase Cr2 Nb
章炜; 杜奎; 盛立远; 叶恒强
2013
Source Publication电子显微学报
ISSN1000-6281
Volume32.0Issue:004Pages:279-283
Abstract本文利用像差矫正透射电子显微镜,在具有C14结构的Laves相Cr2Nb中观察到两种新型的(1101)棱锥面层错结构,并对这些层错的精细构型进行了分析。结果表明:这两种棱锥面层错具有形状特异的结构单元,同时原有的Laves相中的原子配位数也发生改变,在其中一种层错内还形成了拓扑密堆相中不常见的13配位数。这两种新的堆垛方式丰富了对拓扑密堆相中缺陷结构的认识。
Other AbstractBy using aberration-corrected high-resolution transmission electron microscopy, two types of novel stacking faults on (1101) pyramidal planes in C14 Laves phase Cr2Nb were investigated. The results show that these two stacking faults possess abnormal shapes of building blocks. Furthermore, the original coordination numbers of atoms in the C14 Laves phase have been changed, and a CN13 coordination number is formed in the stacking faults, which is rarely reported in TCP phases. These new defect structures would enrich our understanding of the structure of TCP phases.
KeywordLaves相 金属间化合物 Cr2Nb 层错 像差矫正高分辨透射电镜
Indexed ByCSCD
Language中文
CSCD IDCSCD:4924000
Citation statistics
Cited Times:4[CSCD]   [CSCD Record]
Document Type期刊论文
Identifierhttp://ir.imr.ac.cn/handle/321006/155115
Collection中国科学院金属研究所
Affiliation中国科学院金属研究所
Recommended Citation
GB/T 7714
章炜,杜奎,盛立远,等. Laves相Cr2 Nb中棱锥面层错结构的像差矫正电子显微学分析[J]. 电子显微学报,2013,32.0(004):279-283.
APA 章炜,杜奎,盛立远,&叶恒强.(2013).Laves相Cr2 Nb中棱锥面层错结构的像差矫正电子显微学分析.电子显微学报,32.0(004),279-283.
MLA 章炜,et al."Laves相Cr2 Nb中棱锥面层错结构的像差矫正电子显微学分析".电子显微学报 32.0.004(2013):279-283.
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