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一种利用稳态法测量薄膜导热性能的装置
邰凯平、赵洋
2019-08-16
Rights Holder邰凯平、赵洋
Country中国
Subtype实用新型
Patent Number201821995605.9
Document Type专利
Identifierhttp://ir.imr.ac.cn/handle/321006/158420
Collection中国科学院金属研究所
Affiliation中国科学院金属研究所
Recommended Citation
GB/T 7714
邰凯平、赵洋. 一种利用稳态法测量薄膜导热性能的装置. 201821995605.9[P]. 2019-08-16.
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