| 一种利用稳态法测量薄膜导热性能的装置 | |
| 邰凯平、赵洋 | |
| 2019-08-16 | |
| Rights Holder | 邰凯平、赵洋 |
| Country | 中国 |
| Subtype | 实用新型 |
| Patent Number | 201821995605.9 |
| Document Type | 专利 |
| Identifier | http://ir.imr.ac.cn/handle/321006/158420 |
| Collection | 中国科学院金属研究所 |
| Affiliation | 中国科学院金属研究所 |
| Recommended Citation GB/T 7714 | 邰凯平、赵洋. 一种利用稳态法测量薄膜导热性能的装置. 201821995605.9[P]. 2019-08-16. |
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