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Influence of flexoelectric effects on domain switching in ferroelectric films
Zou, M. J.1,2; Tang, Y. L.3; Feng, Y. P.1,2; Geng, W. R.1,2; Ma, X. L.3,4; Zhu, Y. L.1,3
通讯作者Zhu, Y. L.(ylzhu@imr.ac.cn)
2021-05-14
发表期刊JOURNAL OF APPLIED PHYSICS
ISSN0021-8979
卷号129期号:18页码:9
摘要Flexoelectricity has been shown to be an effective strategy to modulate the polarization configurations, domain structures, and physical properties in nanoscale ferroelectric thin films. However, the relations between the domain switching processes and flexoelectric effects remain elusive, which is essential for the design of nanoscale ferroelectric electric devices. In this work, strain-gradient and normal PbTiO3 films are fabricated and investigated to resolve this elusive relationship. By using large-scale and local piezoelectric force microscopy characterization, the ferroelectric domain switching in strain-gradient PbTiO3 films is found to be hard and hindered under applied electric fields compared with the normal ones. Successive atomic-scale scanning transmission electron microscopy imaging analysis manifests that the domains in the strain-gradient PbTiO3 films are stabilized by an additional effective strain gradient-induced flexoelectric field, which was introduced by negative pressure originated from vertically distributed Pb-rich anti-phase domains. This study proposes an effective method to stabilize the ferroelectric polarization in nanoscale ferroelectric films, thus facilitate improving the reliability of ferroelectric electronic devices.
资助者National Natural Science Foundation of China (NNSFC) ; Key Research Program of Frontier Sciences CAS ; Shenyang National Laboratory for Materials Science ; Youth Innovation Promotion Association CAS
DOI10.1063/5.0048535
收录类别SCI
语种英语
资助项目National Natural Science Foundation of China (NNSFC)[51971223] ; National Natural Science Foundation of China (NNSFC)[51922100] ; Key Research Program of Frontier Sciences CAS[QYZDJ-SSW-JSC010] ; Shenyang National Laboratory for Materials Science[L2019R06] ; Shenyang National Laboratory for Materials Science[L2019R08] ; Shenyang National Laboratory for Materials Science[L2019F01] ; Shenyang National Laboratory for Materials Science[L2019F13] ; Youth Innovation Promotion Association CAS[2016177]
WOS研究方向Physics
WOS类目Physics, Applied
WOS记录号WOS:000692768700001
出版者AIP Publishing
引用统计
被引频次:6[WOS]   [WOS记录]     [WOS相关记录]
文献类型期刊论文
条目标识符http://ir.imr.ac.cn/handle/321006/166882
专题中国科学院金属研究所
通讯作者Zhu, Y. L.
作者单位1.Songshan Lake Mat Lab, Dongguan 523808, Guangdong, Peoples R China
2.Chinese Acad Sci, Inst Phys, Beijing 100190, Peoples R China
3.Chinese Acad Sci, Shenyang Natl Lab Mat Sci, Inst Met Res, Wenhua Rd 72, Shenyang 110016, Peoples R China
4.Lanzhou Univ Technol, State Key Lab Adv Proc & Recycling Nonferrous Met, Langongping Rd 287, Lanzhou 730050, Peoples R China
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GB/T 7714
Zou, M. J.,Tang, Y. L.,Feng, Y. P.,et al. Influence of flexoelectric effects on domain switching in ferroelectric films[J]. JOURNAL OF APPLIED PHYSICS,2021,129(18):9.
APA Zou, M. J.,Tang, Y. L.,Feng, Y. P.,Geng, W. R.,Ma, X. L.,&Zhu, Y. L..(2021).Influence of flexoelectric effects on domain switching in ferroelectric films.JOURNAL OF APPLIED PHYSICS,129(18),9.
MLA Zou, M. J.,et al."Influence of flexoelectric effects on domain switching in ferroelectric films".JOURNAL OF APPLIED PHYSICS 129.18(2021):9.
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