High-temperature aging time-induced composition and thickness evolution in the native oxides film on Sn solder substrate

doi:10.1007/s10854-021-06887-2

IMR OpenIR

	High-temperature aging time-induced composition and thickness evolution in the native oxides film on Sn solder substrate
	Qiao, Chuang 1,2; Sun, Xu 2,3; Wang, Youzhi 2,4; Hao, Long 2,4; Liu, Xiahe 1; An, Xizhong 1
通讯作者	Hao, Long(chinahaolong@126.com)
	2021-09-02
发表期刊	JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS
ISSN	0957-4522
页码	20
摘要	The presence of a native oxides film on Pb-free Sn solder joint surface is inevitable and its structure could be influenced by high-temperature aging due to heat release of electronic device itself during application. In this work, the effect of high-temperature aging time at 90 degrees C on composition and thickness evolution of a native oxides film, formed on pure Sn solder substrate after 24 h exposure to 90% RH atmosphere at 25 degrees C, has been characterized by AR-XPS and EIS. Results indicate that the outer layer of the as-obtained native oxide film consists of more Sn(OH)(4) and less SnO2, and the inner layer consists of more SnO and less Sn(OH)(2). The aging process initially accelerates both the dehydration/oxidation of hydroxides/stannous oxides in the film and the fresh Sn substrate to form SnO2, contributing to an increasing thickness and improved corrosion resistance of the film. However, an extended aging time deteriorates the structure of the film with more cracks and lowered corrosion resistance. Moreover, comparison finds that, without any assumption on models of resistivity distribution through the oxides film, the film thickness determination by Cole-Cole representation of the EIS results fits well with that by AR-XPS analyses.
资助者	CAS Key Laboratory of Nuclear Materials and Safety Assessment, Institute of Metal Research Chinese Academy of Sciences
DOI	10.1007/s10854-021-06887-2
收录类别	SCI
语种	英语
资助项目	CAS Key Laboratory of Nuclear Materials and Safety Assessment, Institute of Metal Research Chinese Academy of Sciences
WOS研究方向	Engineering ; Materials Science ; Physics
WOS类目	Engineering, Electrical & Electronic ; Materials Science, Multidisciplinary ; Physics, Applied ; Physics, Condensed Matter
WOS记录号	WOS:000692095300003
出版者	SPRINGER
引用统计	被引频次：11[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	http://ir.imr.ac.cn/handle/321006/166886
专题	中国科学院金属研究所
通讯作者	Hao, Long
作者单位	1.Northeastern Univ, Sch Met, Key Lab Ecol Met Multimetall Mineral, Minist Educ, Shenyang 110819, Peoples R China 2.Chinese Acad Sci, Inst Met Res, CAS Key Lab Nucl Mat & Safety Assessment, Shenyang 110016, Peoples R China 3.Shenyang Ligong Univ, Coll Mat Sci & Engn, Shenyang 110159, Peoples R China 4.Univ Sci & Technol China, Sch Mat Sci & Engn, Hefei 230026, Peoples R China
推荐引用方式 GB/T 7714	Qiao, Chuang,Sun, Xu,Wang, Youzhi,et al. High-temperature aging time-induced composition and thickness evolution in the native oxides film on Sn solder substrate[J]. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS,2021:20.
APA	Qiao, Chuang,Sun, Xu,Wang, Youzhi,Hao, Long,Liu, Xiahe,&An, Xizhong.(2021).High-temperature aging time-induced composition and thickness evolution in the native oxides film on Sn solder substrate.JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS,20.
MLA	Qiao, Chuang,et al."High-temperature aging time-induced composition and thickness evolution in the native oxides film on Sn solder substrate".JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS (2021):20.