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反应磁控溅射掺杂ZnO透明导电氧化物薄膜的研究
其他题名INVESTIGATION ON DOPED-ZINC OXIDE TRANSPARENT CONDUCTING OXIDE THIN FILM PREPARED BY REACTIVE MAGNETRON SPUTTERING
张小波
学位类型博士
导师孙超
2007-08-19
学位授予单位中国科学院金属研究所
学位授予地点金属研究所
学位专业材料加工工程
关键词磁控溅射 透明导电氧化物薄膜 Zno 电学 光学性能 低温沉积
摘要本论文开展了圆形平面磁控靶的模拟设计和反应磁控溅射ZnO:Al (AZO)薄膜低温沉积工艺的研究。以常规圆形平面磁控靶为典型例子,采用有限元磁场模拟计算分析了磁控靶结构参数的影响;针对外加电磁线圈磁控溅射系统,分析了电磁线圈位置和激励模式对磁控辉光等离子体特性和靶材利用率的影响,并在此基础上提出一种新的外加电磁线圈磁控溅射方式。研究了工艺参数对反应磁控溅射AZO薄膜光电性能、组织结构、化学成分及其空间分布的影响。对AZO薄膜电性能空间不均匀的机理进行了探索,讨论了文献中的两种主要争议观点以及AZO薄膜的低温制备工艺。 研究结果表明:使用高导磁材料的磁轭结构可以显著增加靶面场强,有利于增加中间磁钢通量,使磁控靶趋于平衡态;调整内外磁钢高度/宽度皆能显著改变磁控靶磁场位形及其非平衡度,其中靶面磁场强度变化受磁钢宽度调整更为明显,磁钢高度的确定主要是从调节磁控靶非平衡度的角度来考虑;随着靶材和铜背板厚度的增加,靶面的水平磁场强度下降显著,起辉电压随之呈上升趋势。 外加电磁线圈可以在较大范围内控制基片等离子体参数,基片饱和离子流密度变化是基片附近穿过的磁力线强度/位形变化的结果。从控制基片等离子体参数范围角度,线圈位置适宜放置在基片附近。线圈在交流AC激励模式下工作时,可提高靶材利用率,其中靶材利用率与线圈位置高度相关,线圈适宜放置在磁控靶附近;相对于直流DC模式,线圈在AC激励模式下对磁控靶伏安特性的影响不大,有利于溅射过程稳定性。提出一种新的装置/工作方法,将一对螺旋线圈分别放置于磁控靶和基片附近,并分别以AC/DC激励模式工作,可以在提高靶材利用率的同时,独立控制基片附近等离子体参数。 对于在较低温度下TS= 90°C 和低等离子体密度LPD (Ji/Jn< 0.3)条件下沉积AZO薄膜,表现出明显的应力和电阻率空间分布。提高基片温度 (TS= 200 °C)可以显著改善AZO薄膜的电学性能(电阻率下降一个数量级以上)及其空间分布均匀性;增强基片处低能离子轰击(Ji/Jn> 2)具有相同的改善作用,但依赖于基片温度,改善作用主要体现在基片温度较低时如<100℃有效,而在较高温度下其作用不明显;工作压强对AZO薄膜电阻率的影响相对不明显,随压强的增加,薄膜电学性能分布均匀性稍有改善。离子轰击的作用取决于入射离子能量的消散机制。当入射粒子能量EiEPet时,离子嵌入机制开始起主导作用,入射离子将嵌入生长薄膜的晶格之中,造成晶格损伤。高能离子嵌入机制是造成AZO薄膜电学性能下降及其空间不均匀分布的主要机制,而活性氧机制是次要机制,后者在较低基片温度和等离子体密度下表现逐渐明显。高能负氧离子轰击造成能量离子嵌入机制的主要原因,而低能的正离子轰击有利于提高AZO薄膜的结晶质量和光电性能。
其他摘要This dissertation mainly includes two parts: simulation and design of (external solenoid coil) circular planar magnetron and low temperature deposition of aluminum-doped zinc oxide (AZO) thin film prepared by reactive magnetron sputtering, respectively. At first, considering conventional circular planar magnetron as an example, we studied the effects of magnetron component parameters by finite-element method (FEM) simulation of magnetic field configuration, analyzed the influence of external solenoid coil arrangement and excitation mode on plasma characteristics and target utilization, and proposed a novel magnetron sputtering method. Additionally, we also investigated the effects of various growth conditions on electrical properties and spatial distribution of the ZnO:Al (AZO) thin films prepared by dc magnetron sputtering at low deposition temperature, with emphasis on the origin of the resistivity inhomogeneity across the substrate. The results revealed that the using of yoke with a high permeability can remarkably enhances the magnetic field on the target and makes the magnetron more balanced; the magnetic field configuration and unbalanced degree of the magnetron can be significantly influenced by their width rather than their height of inner/ external magnets, and the height of magnets are mainly determined from the perspective of the control of unbalanced degree. As the increase of the thicknesses of target and backboard, the magnetic field on the target surface rapidly reduced and the ignition voltage of glow discharge correspondingly decreased to some extent. Langmuir probe measurement showed that the coil position had a strong effect on the near-substrate plasma parameters, resulting from the variations of magnetic field configuration in the substrate region. It was a relatively simple and effective method to improve the target utilization by supplying low frequency AC power to the external coil situated around the magnetron. The target utilization efficiency was highly sensitive to the coil position. The coil was more suitable to be placed in the vicinity of the magnetron than near the substrate for improving the target utilization. Compared with that operated in DC mode, the coils excited in AC mode have a minor influence in the I-V characteristics of magnetron and advantage in the maintain the stability of sputtering process. Finally, a novel method was proposed to simultaneously improve target materials utilization and control the near-substrate plasma density in a broad range by choosing an appropriate solenoid coil arrangement and excitation mode. The crystalline, stress and electrical properties of the films were found to be strongly dependent on growth temperature TS and ion-to-neutral ratio Ji/Jn. Under the low Ji/Jn (<0.3) conditions, the TS exerted a remarkable influence on film quality. The films prepared at 90 °C were highly compressed, exhibiting poor electrical properties and significant spatial distribution. High quality films with low stress and resistivity were produced at higher TS (200 °C). Similarly, at lower TS (90 °C), higher Ji/Jn (~2) dramatically improved the film resistivity as well as its lateral distribution. Moreover, it indicated that the role of ion bombardment is dependent on the mechanism of dissipation of incident species. Ion bombardment is beneficial to the film growth if the energy of incident species Ei is below the penetration threshold EPet (~33 eV for ZnO), while the energy sub-implant mechanism would work, on the other hand, the bombardment degrades the film quality when Ei is over the EPet. The energetic bombardment of negative oxygen ions rather than the positives dominated the resistivity distribution of AZO films, while the non-uniform distribution of active oxygen played a secondary role which was otherwise more notable under conditions of lower TS and Ji/Jn.
页数136
语种中文
文献类型学位论文
条目标识符http://ir.imr.ac.cn/handle/321006/17059
专题中国科学院金属研究所
推荐引用方式
GB/T 7714
张小波. 反应磁控溅射掺杂ZnO透明导电氧化物薄膜的研究[D]. 金属研究所. 中国科学院金属研究所,2007.
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