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ZnO基透明导电膜溶胶-凝胶法制备、结构表征及性能
其他题名PREPARATION OF TCO FILMS BASED ON ZINC OXIDE BY SOL-GEL METHOD AND THEIR STRUCTURE CHARACTERIZATION AND PROPERTIES
黄辉
学位类型硕士
导师姜辛
2007-06-09
学位授予单位中国科学院金属研究所
学位授予地点金属研究所
学位专业材料加工工程
关键词溶胶-凝胶 氧化锌 掺杂 光学性能 电学性能
摘要ZnO基TCO(Transparent conductive oxide)薄膜具有同ITO(In2O3:Sn)可比拟的光电性能,且成本更低、无毒、稳定性更好。特别地,较之一般的TCO薄膜,ZnO:F薄膜具有更高的透过率、更高的迁移率和更强的抗氢等离子侵蚀性能,且更易刻蚀。但目前ZnO:F薄膜成功的制备方法只有化学气相沉积(CVD),探索新的更有效的制备方法具有重要意义。ZnO基p型半导体薄膜的研究进展缓慢。开发出稳定的低电阻率的p型ZnO基半导体,将使ZnO能更广泛地用于光电器件。较之ZnO薄膜其它制备方法,溶胶-凝胶法的突出优点是所需设备简单、可大面积沉积和易于掺杂。 本文采用溶胶-凝胶提拉法,以乙酸锌为前驱体,首先通过改变溶剂、溶胶稳定剂、预处理温度和最终处理温度制备出不同工艺参数的未掺杂ZnO薄膜。然后,单乙醇胺为溶胶稳定剂,分别以三氟乙酸、醋酸铵和氟化铵分别为掺杂源,通过过量掺杂和调整最终处理方式,尝试制备了ZnO:F薄膜、ZnO:N薄膜和 ZnO:(N,F)薄膜。并用XRD、SEM、AFM、XPS和 UV-Vis spectrometer对ZnO基薄膜结构、成分、元素化学态和光学性能进行了表征。 溶剂、溶胶稳定剂、预处理温度和最终处理温度等工艺参数对未掺杂薄膜微结构尤其是择优取向具有明显影响。另外,未掺杂ZnO薄膜的紫外截止频率受最终处理温度影响较大,而受预处理温度影响很小。 以三氟乙酸(CF3COOH)为掺杂源,空气中最终处理时,F难以掺入到薄膜当中。而在有ZnF2粉末作为耗氧物质的真空中最终处理时,F掺入到薄膜中,但残留未向ZnO转化的单乙酸锌。 ZnO:N薄膜在可见光区的透过率比未掺杂ZnO 薄膜低,其紫外截止吸收边相对于未掺杂ZnO薄膜有一较小的红移。 以氟化铵(NH4F)为掺杂源,在真空中或者高纯Ar中最终处理,F和N都掺入到薄膜中。薄膜中微量的F键合Zn,大部分的F键合C,而N以N-H键和N-C键的形式存在,不存在N-Zn键。 在空气中450℃最终处理后,薄膜中的F和N消失。但F和N在最终处理结束前短暂存在,影响了薄膜生长过程。NH4F起始掺杂量不同时,薄膜晶粒尺寸和紫外截止频率不同。
其他摘要ABSTRACT Preparation of TCO films based on ZnO by sol-gel method and their structure characterization and properties Hui Huang (Materials Processing Engineering) Supervised by Prof. Xin Jiang and Prof. Chao Sun TCO films based on ZnO not only possess comparable optical and electrical properties as ITO, but also demonstrate low cost, nontoxicity, and high stability. Especially, ZnO:F films have higher transmittance, higher mobility,stronger resistance to corrosion of hydrogen plasma, and moreover are easier to be etched than normal TCO films. But ZnO:F films were only successfully prepared by CVD technique . It is significant to exploit new and effective methods for making ZnO:F films. The research work which aims to make p-type ZnO semiconductor have made little progress. But no other than p-type ZnO with low resistance and high stability can make itself be used in photoelectric devices extensively. Sol-gel method need simple equipment and is easy for doping and making large area coating. Firstly, undoped ZnO films were prepared by sol-gel dip-coating, when zinc acetate acted as starting material. Effects of different processing parameters on undoped ZnO films were investigated. Secondly, ZnO:F films, ZnO:N films and ZnO:(N,F) films were made by adding excessive CF3COOH, CH3COONH4 and NH4F in starting solution as doping source, respectively.Special final heattreatment was adopted to obtain the final film. Structure, component, chemical condition of elements and optical transmittance of those films were characterized by XRD, SEM, AFM, XPS and UV-Vis spectrometer. The preferred orientation of ZnO films was influenced by solvent, sol stabilizer, pretreating and post-treating temperature. Post-treating temperature influenced the cut-off frequency in the UV region. It was difficult to dope fluorine into ZnO:F films with post-treatment in air, when CF3COOH acted as doping source. Fluorine was successfully doped into the film, when the film was post-treated in vacuum with ZnF2 powder as oxygen consumer. But there was zinc monoacetate in addition to ZnO in the film. ZnO:N films had less transmittance in visible region than undoped ZnO film. In addition, the absorption edge in UV region of ZnO:N films had small red shift in comparison with undoped ZnO films . F and N were doped into the films which were post-treated at vacuum or Ar, when NH4F was added into starting solution. A small quality of fluorine atoms bonded to Zn, while large numbers of fluorine atoms bonded to C. Nitrogen atoms bonded to C or H, but no N-Zn bond existed in the films. F and N vanished when the films were post-treated in air. However transitory existence of F and N in films influenced the growth of the films, before the end of post-treatment. Different doping quality in starting solution caused different grain sizes and different cut-off frequencies in the UV region.
页数75
语种中文
文献类型学位论文
条目标识符http://ir.imr.ac.cn/handle/321006/17075
专题中国科学院金属研究所
推荐引用方式
GB/T 7714
黄辉. ZnO基透明导电膜溶胶-凝胶法制备、结构表征及性能[D]. 金属研究所. 中国科学院金属研究所,2007.
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