| Defect control in digital light processing of high-solid-loading ceramic core | |
| Mu, Yahang1,2; Chen, Jiawang1,2; An, Xiaolong1,2,4; Liang, Jingjing1,2,3; Li, Jinguo1,2,3; Zhou, Yizhou2; Sun, Xiaofeng2 | |
| 通讯作者 | An, Xiaolong(xlan19b@imr.ac.cn) ; Liang, Jingjing(jjliang@imr.ac.cn) ; Li, Jinguo(jgli@imr.ac.cn) |
| 2022-10-01 | |
| 发表期刊 | CERAMICS INTERNATIONAL
 |
| ISSN | 0272-8842 |
| 卷号 | 48期号:19页码:28739-28744 |
| 摘要 | In order to investigate the defect control mechanism and the optimal cure parameter window, high-solid-loading ceramic-core green-body samples were fabricated by digital light processing (DLP) with different cure parameters. The defects appearing on the sample surface were observed. The causes of the wrong-cured zone and the propagation mechanism of UV light in the ceramic suspension were explained. The effect of different cure parameters on the printed structure of single- and multi-layer samples was investigated. The results showed that the single-layer sample had excellent cure accuracy, and the step effect was significantly reduced in the multi-layer samples at the exposure energy density of 6-8 mW/cm(2) and the exposure time of 2.5-3.5s. Based on the systematic observation of the sample structure, a system |
| 关键词 | Defects Digital light processing Suspension Ceramic core |
| 资助者 | National Science and Technology Major Project, China |
| DOI | 10.1016/j.ceramint.2022.06.141 |
| 收录类别 | SCI |
| 语种 | 英语 |
| 资助项目 | National Science and Technology Major Project, China[Y2019-VII-0011-0151] |
| WOS研究方向 | Materials Science |
| WOS类目 | Materials Science, Ceramics |
| WOS记录号 | WOS:000892881800006 |
| 出版者 | ELSEVIER SCI LTD |
| 引用统计 | |
| 文献类型 | 期刊论文 |
| 条目标识符 | http://ir.imr.ac.cn/handle/321006/176140 |
| 专题 | 中国科学院金属研究所 |
| 通讯作者 | An, Xiaolong; Liang, Jingjing; Li, Jinguo |
| 作者单位 | 1.Univ Sci & Technol China, Sch Mat Sci & Engn, Shenyang 110016, Peoples R China 2.Chinese Acad Sci, Inst Met Res, Shi changxu Innovat Ctr Adv Mat, Shenyang 110016, Peoples R China 3.Space Mfg Technol CAS Key Lab, Beijing 100094, Peoples R China 4.Semicond Mfg Int Corp, Shanghai 201203, Peoples R China |
| 推荐引用方式 GB/T 7714 | Mu, Yahang,Chen, Jiawang,An, Xiaolong,et al. Defect control in digital light processing of high-solid-loading ceramic core[J]. CERAMICS INTERNATIONAL,2022,48(19):28739-28744. |
| APA | Mu, Yahang.,Chen, Jiawang.,An, Xiaolong.,Liang, Jingjing.,Li, Jinguo.,...&Sun, Xiaofeng.(2022).Defect control in digital light processing of high-solid-loading ceramic core.CERAMICS INTERNATIONAL,48(19),28739-28744. |
| MLA | Mu, Yahang,et al."Defect control in digital light processing of high-solid-loading ceramic core".CERAMICS INTERNATIONAL 48.19(2022):28739-28744. |
| 条目包含的文件 | 条目无相关文件。 | |||||
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