Detecting the structural evolution of passive film induced by<i> Shewanella</i><i> oneidensis</i> MR-1 using aberration-corrected TEM

doi:10.1016/j.jmst.2023.10.066

IMR OpenIR

	Detecting the structural evolution of passive film induced by Shewanella oneidensis MR-1 using aberration-corrected TEM
	Hu, Z. C.2; Wei, X. X.3; Zhang, B.3; Xu, D. K.4,5; Zhang, G. T.2; Tang, K.2; Ma, X. L.3
通讯作者	Zhang, B.(bozhang@sslab.org.cn) ; Xu, D. K.(xudake@mail.neu.edu.cn) ; Ma, X. L.(xlma@sslab.org.cn)
	2025-03-01
发表期刊	JOURNAL OF MATERIALS SCIENCE & TECHNOLOGY
ISSN	1005-0302
卷号	210 页码:278-283
资助者	National Natural Science Foun-dation of China
DOI	10.1016/j.jmst.2023.10.066
收录类别	SCI
语种	英语
资助项目	National Natural Science Foun-dation of China[52371071] ; National Natural Science Foun-dation of China[51971228] ; National Natural Science Foun-dation of China[51771212]
WOS研究方向	Materials Science ; Metallurgy & Metallurgical Engineering
WOS类目	Materials Science, Multidisciplinary ; Metallurgy & Metallurgical Engineering
WOS记录号	WOS:001364269800001
出版者	ELSEVIER
引用统计
文献类型	期刊论文
条目标识符	http://ir.imr.ac.cn/handle/321006/181520
专题	中国科学院金属研究所
通讯作者	Zhang, B.; Xu, D. K.; Ma, X. L.
作者单位	1.Chinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, Shenyang 110016, Peoples R China 2.Univ Sci & Technol China, Sch Mat Sci & Engn, Shenyang 110016, Peoples R China 3.Songshan Lake Mat Lab, Bay Area Ctr Electron Microscopy, Dongguan 523808, Peoples R China 4.Northeastern Univ, Shenyang Natl Lab Mat Sci, Shenyang 110819, Peoples R China 5.Northeastern Univ, Sch Mat Sci & Engn, Key Lab Anisotropy & Texture Mat, Minist Educ, Shenyang 110819, Peoples R China
推荐引用方式 GB/T 7714	Hu, Z. C.,Wei, X. X.,Zhang, B.,et al. Detecting the structural evolution of passive film induced by Shewanella oneidensis MR-1 using aberration-corrected TEM[J]. JOURNAL OF MATERIALS SCIENCE & TECHNOLOGY,2025,210:278-283.
APA	Hu, Z. C..,Wei, X. X..,Zhang, B..,Xu, D. K..,Zhang, G. T..,...&Ma, X. L..(2025).Detecting the structural evolution of passive film induced by Shewanella oneidensis MR-1 using aberration-corrected TEM.JOURNAL OF MATERIALS SCIENCE & TECHNOLOGY,210,278-283.
MLA	Hu, Z. C.,et al."Detecting the structural evolution of passive film induced by Shewanella oneidensis MR-1 using aberration-corrected TEM".JOURNAL OF MATERIALS SCIENCE & TECHNOLOGY 210(2025):278-283.