Microstructure evolution of interface and matrix during the preparation of SiCf/Ti60 composites

doi:10.1016/j.matchar.2024.114111

IMR OpenIR

	Microstructure evolution of interface and matrix during the preparation of SiCf/Ti60 composites
	Gan, Zhicong 1,2; Wang, Yumin 1; Zhang, Xu 1; Yang, Lina 1; Jia, Qiuyue 1; Kong, Xu 1; Zhang, Guoxing 1; Yang, Qing 1; Yang, Rui 1
通讯作者	Wang, Yumin(yuminwang@imr.ac.cn) ; Yang, Rui(ryang@imr.ac.cn)
	2024-08-01
发表期刊	MATERIALS CHARACTERIZATION
ISSN	1044-5803
卷号	214 页码:10
摘要	In this paper, continuous SiC fiber-reinforced Ti60 (SiCf/Ti60) composites were fabricated by preparing SiCf/ Ti60 precursor wires from matrix-coated fibers and hot isostatic pressing (HIP) consolidation. The microstructures of the precursor wires and composites were investigated using XRD, SEM, EPMA, EBSD, and TEM, which led to the microstructure evolution of the composites. The conclusions of this study are as follows. 1. A reaction layer (RL) with a thickness of approximately 0.1 mu m already exists at the interface of the precursor wires during the preparation. The HIP process accelerates the diffusion of the carbon coating with the Ti60 matrix, resulting in an increase in the thickness of the RL to approximately 0.5 mu m. This layer is primarily composed of fine-grained TiC layer \|\| discontinuous silicides \|\| coarse-grained TiC layer. 2. The matrix of SiCf/Ti60 precursor wires contains alpha-Ti (- 1.9 mu m), S2 (- 50 nm), and beta-Ti (- 50 nm), in the matrix, beta-Ti is precipitated from alpha-Ti, and HIP makes alpha-Ti, S2, and beta-Ti grow to - 2.4 mu m, - 200 nm, and - 300 nm, respectively. 3. There are (0001)//axial direction (AD) and (10-10)//AD fiber textures in the matrix of the precursor wires, and HIP makes the matrix undergo a plastic deformation dominated by dislocation slip, and the pole density of the two kinds of textures are both increased.
关键词	SiC f /Ti60 composites Hot isostatic pressing Reaction layer Matrix microstructure
资助者	CAS Project for Young Scientists in Basic Research ; National Science and Technology Major Project of China ; National Natural Science Foundation of China ; Key Deployment Programme of the Chinese Academy of Sciences ; Basic research major projects
DOI	10.1016/j.matchar.2024.114111
收录类别	SCI
语种	英语
资助项目	CAS Project for Young Scientists in Basic Research[YSBR-025] ; National Science and Technology Major Project of China[J2019 -VI -0007-0121] ; National Natural Science Foundation of China[52101164] ; Key Deployment Programme of the Chinese Academy of Sciences[KGFZD-145-23-39] ; Basic research major projects[JCKY2023203A003]
WOS研究方向	Materials Science ; Metallurgy & Metallurgical Engineering
WOS类目	Materials Science, Multidisciplinary ; Metallurgy & Metallurgical Engineering ; Materials Science, Characterization & Testing
WOS记录号	WOS:001260691900001
出版者	ELSEVIER SCIENCE INC
引用统计
文献类型	期刊论文
条目标识符	http://ir.imr.ac.cn/handle/321006/187634
专题	中国科学院金属研究所
通讯作者	Wang, Yumin; Yang, Rui
作者单位	1.Chinese Acad Sci, Inst Met Res, Shenyang 110016, Peoples R China 2.Univ Sci & Technol China, Sch Mat Sci & Engn, Shenyang 110016, Peoples R China
推荐引用方式 GB/T 7714	Gan, Zhicong,Wang, Yumin,Zhang, Xu,et al. Microstructure evolution of interface and matrix during the preparation of SiCf/Ti60 composites[J]. MATERIALS CHARACTERIZATION,2024,214:10.
APA	Gan, Zhicong.,Wang, Yumin.,Zhang, Xu.,Yang, Lina.,Jia, Qiuyue.,...&Yang, Rui.(2024).Microstructure evolution of interface and matrix during the preparation of SiCf/Ti60 composites.MATERIALS CHARACTERIZATION,214,10.
MLA	Gan, Zhicong,et al."Microstructure evolution of interface and matrix during the preparation of SiCf/Ti60 composites".MATERIALS CHARACTERIZATION 214(2024):10.