IMR OpenIR
磁控溅射Cu/Al多层膜的固相反应
汪伟,卢柯
2003-01-11
Source Publication金属学报
Issue1Pages:1-4
Abstract采用磁控溅射技术制备了原子比为2:1、调制周期Λ分别为20和5 nm的Cu/Al多层膜.用X射线衍射(XRD),透射电镜(TEM)和热分析(DSC)等技术研究了多层膜的固相反应. Λ=20 nm的多层膜样品中铜和铝膜均沿(111)方向择优生长,加热至145℃时生成α—Cu固溶体,超过191℃时生成γ2-Cu9Al4相.制备态Λ=5 nm的样品有α—Cu生成.加热时γ2-Cu9Al4的生成温度显著降低(134℃).测定了Λ=20 nm多层膜样品中α—Cu和γ2-Cu9Al4的形成激活能分别为0.56 eV和0.79 eV,后者与文献值相符.
description.department中国科学院金属研究所沈阳材料科学(联合)国家实验室,中国科学院金属研究所沈阳材料科学(联合)国家实验室 沈阳110016,沈阳110016
Keyword磁控溅射 Cu/al多层膜 固相反应
Document Type期刊论文
Identifierhttp://ir.imr.ac.cn/handle/321006/26251
Collection中国科学院金属研究所
Recommended Citation
GB/T 7714
汪伟,卢柯. 磁控溅射Cu/Al多层膜的固相反应[J]. 金属学报,2003(1):1-4.
APA 汪伟,卢柯.(2003).磁控溅射Cu/Al多层膜的固相反应.金属学报(1),1-4.
MLA 汪伟,卢柯."磁控溅射Cu/Al多层膜的固相反应".金属学报 .1(2003):1-4.
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