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Tin Whisker Growth on NdSn(3) Powder
H. C. Shi; A. P. Xian
2011
发表期刊Journal of Electronic Materials
ISSN0361-5235
卷号40期号:9页码:1962-1966
摘要Tin whiskers grew rapidly and spontaneously on NdSn(3) powder under atmospheric conditions. By in situ optical microscopy observation, the incubation period of whisker growth was found to be very short, only about 10 min to 30 min, and the whisker growth rate was very high (up to 73 angstrom/s). It is proposed that the strong tendency for whisker growth on NdSn(3) powder indicates that such growth is closely related to decomposition of NdSn(3) under atmospheric conditions. An electron beam irradiation effect on whisker growth was also observed, in which the whiskers cease to grow after observation by scanning electron microscopy (SEM).
部门归属[shi, hong-chang; xian, ai-ping] chinese acad sci, shenyang natl lab mat sci, inst met res, shenyang 110016, peoples r china.;shi, hc (reprint author), chinese acad sci, shenyang natl lab mat sci, inst met res, shenyang 110016, peoples r china;ap.xian@imr.ac.cn
关键词Tin Whiskers Rare Earth Intermetallic Compounds Sn Ndsn(3) Pb-free Solders Mechanism
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文献类型期刊论文
条目标识符http://ir.imr.ac.cn/handle/321006/30657
专题中国科学院金属研究所
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H. C. Shi,A. P. Xian. Tin Whisker Growth on NdSn(3) Powder[J]. Journal of Electronic Materials,2011,40(9):1962-1966.
APA H. C. Shi,&A. P. Xian.(2011).Tin Whisker Growth on NdSn(3) Powder.Journal of Electronic Materials,40(9),1962-1966.
MLA H. C. Shi,et al."Tin Whisker Growth on NdSn(3) Powder".Journal of Electronic Materials 40.9(2011):1962-1966.
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