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Deposition, structure and hardness of Ti-Cu-N hard films prepared by pulse biased arc ion plating
X. Q. Wang; Y. H. Zhao; B. H. Yu; J. Q. Xiao; F. Q. Li
2011
Source PublicationVacuum
ISSN0042-207X
Volume86Issue:4Pages:415-421
AbstractIn this work, Ti-Cu-N hard nanocomposite films were deposited on 304 stainless steel (SS) substrate by using pulse biased arc ion plating system with Ti-Cu alloy target. The effects of negative substrate pulse bias voltages on chemical composition, structure, morphology and mechanical properties were investigated. The composition and structure of these films was found to be dependent on the pulse bias, whereas the pulse biases put little influence on hardness of these films. The XPS spectra of Cu 2p showed that obtained peak values correspond to pure metallic Cu. Cu content in Ti-Cu-N nanocomposite films changed with pulse bias voltage. In addition, X-ray diffraction analysis showed that a pronounced TiN (111) texture is observed under low pulse bias voltage while it changed to TiN (220) orientation under high pulse bias voltage. Surface roughness of the Ti-Cu-N nanocomposite films achieved to the minimum value of 0.11 mu m with the negative pulse bias voltage of 600 V. The average grain size of TiN was less than 17 nm. The mechanical properties of Ti-Cu-N hard films investigated by nanoindentation revealed that the hardness was about 22-24 GPa and the hardness enhancement was not obtained. Crown Copyright (C) 2011 Published by Elsevier Ltd. All rights reserved.
description.department[zhao, y. h.; yu, b. h.; xiao, j. q.] chinese acad sci, inst met res, shenyang 110016, peoples r china. [wang, x. q.; li, f. q.] shenyang ligong univ, shenyang 110168, peoples r china.;zhao, yh (reprint author), chinese acad sci, inst met res, shenyang 110016, peoples r china;yhzhao@imr.ac.cn
KeywordTi-cu-n Hard Composite Films Pulse Biased Arc Ion Plating Composition Structure Superhard Nanocomposite Coatings Mechanical-properties Zr Bombardment Design Energy Ptsi Dc
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WOS IDWOS:000298212000012
Citation statistics
Cited Times:22[WOS]   [WOS Record]     [Related Records in WOS]
Document Type期刊论文
Identifierhttp://ir.imr.ac.cn/handle/321006/30748
Collection中国科学院金属研究所
Recommended Citation
GB/T 7714
X. Q. Wang,Y. H. Zhao,B. H. Yu,et al. Deposition, structure and hardness of Ti-Cu-N hard films prepared by pulse biased arc ion plating[J]. Vacuum,2011,86(4):415-421.
APA X. Q. Wang,Y. H. Zhao,B. H. Yu,J. Q. Xiao,&F. Q. Li.(2011).Deposition, structure and hardness of Ti-Cu-N hard films prepared by pulse biased arc ion plating.Vacuum,86(4),415-421.
MLA X. Q. Wang,et al."Deposition, structure and hardness of Ti-Cu-N hard films prepared by pulse biased arc ion plating".Vacuum 86.4(2011):415-421.
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