Application of electron backscatter diffraction to the study on orientation distribution of intermetallic compounds at heterogeneous interfaces (Sn/Ag and Sn/Cu) (vol 108, 103518, 2010) | |
H. F. Zou; Z. F. Zhang | |
2011 | |
Source Publication | Journal of Applied Physics
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ISSN | 0021-8979 |
Volume | 109Issue:2 |
description.department | [zou, h. f.; zhang, z. f.] chinese acad sci, inst met res, shenyang natl lab mat sci, shenyang 110016, peoples r china. [zou, h. f.] elect component lab, guangzhou 51060, guangdong, peoples r china.;zou, hf (reprint author), chinese acad sci, inst met res, shenyang natl lab mat sci, shenyang 110016, peoples r china;zhfzhang@imr.ac.cn |
URL | 查看原文 |
WOS ID | WOS:000286896400112 |
Citation statistics | |
Document Type | 期刊论文 |
Identifier | http://ir.imr.ac.cn/handle/321006/31005 |
Collection | 中国科学院金属研究所 |
Recommended Citation GB/T 7714 | H. F. Zou,Z. F. Zhang. Application of electron backscatter diffraction to the study on orientation distribution of intermetallic compounds at heterogeneous interfaces (Sn/Ag and Sn/Cu) (vol 108, 103518, 2010)[J]. Journal of Applied Physics,2011,109(2). |
APA | H. F. Zou,&Z. F. Zhang.(2011).Application of electron backscatter diffraction to the study on orientation distribution of intermetallic compounds at heterogeneous interfaces (Sn/Ag and Sn/Cu) (vol 108, 103518, 2010).Journal of Applied Physics,109(2). |
MLA | H. F. Zou,et al."Application of electron backscatter diffraction to the study on orientation distribution of intermetallic compounds at heterogeneous interfaces (Sn/Ag and Sn/Cu) (vol 108, 103518, 2010)".Journal of Applied Physics 109.2(2011). |
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