Pseudoelastic stacking fault and deformation twinning in nanocrystalline Ni

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	Pseudoelastic stacking fault and deformation twinning in nanocrystalline Ni
	B. Q. Li; M. L. Sui; S. X. Mao
	2010
发表期刊	Applied Physics Letters
ISSN	0003-6951
卷号	97 期号:24
摘要	It is usually believed that the partial dislocation and deformation twin are the results of permanent plasticity in materials. Here, we present in situ atomic-scale observation of reversible stacking fault and deformation twin during loading and unloading in nanocrystalline Ni under high-resolution transmission electron microscopy. The high propensity for the reversibility of the stacking fault and deformation twin is due to the high stacking fault force and small grain size, and will provide an understanding at atomistic scale on the nature of the deformation in nanocrystalline materials. (C) 2010 American Institute of Physics. [doi:10.1063/1.3527976]
部门归属	[sui, m. l.] beijing univ technol, inst microstruct & properties adv mat, beijing 100124, peoples r china. [li, b. q.] chinese acad sci, inst met res, shenyang natl lab mat sci, shenyang 110016, peoples r china. [mao, s. x.] univ pittsburgh, dept mech engn & mat sci, pittsburgh, pa 15261 usa.;sui, ml (reprint author), beijing univ technol, inst microstruct & properties adv mat, beijing 100124, peoples r china;mlsui@bjut.edu.cn smao@engr.pitt.edu
关键词	Molecular-dynamics Simulation Boundary Migration Grain-boundary Dislocation Nucleation Metals Aluminum Crack Twins
URL	查看原文
WOS记录号	WOS:000285481000024
引用统计	被引频次：14[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	http://ir.imr.ac.cn/handle/321006/31197
专题	中国科学院金属研究所
推荐引用方式 GB/T 7714	B. Q. Li,M. L. Sui,S. X. Mao. Pseudoelastic stacking fault and deformation twinning in nanocrystalline Ni[J]. Applied Physics Letters,2010,97(24).
APA	B. Q. Li,M. L. Sui,&S. X. Mao.(2010).Pseudoelastic stacking fault and deformation twinning in nanocrystalline Ni.Applied Physics Letters,97(24).
MLA	B. Q. Li,et al."Pseudoelastic stacking fault and deformation twinning in nanocrystalline Ni".Applied Physics Letters 97.24(2010).