Crack propagation of single crystal beta-Sn during in situ TEM straining

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	Crack propagation of single crystal beta-Sn during in situ TEM straining
	P. J. Shang; Z. Q. Liu; D. X. Li; J. K. Shang
	2010
发表期刊	Journal of Electron Microscopy
ISSN	0022-0744
卷号	59 页码:S61-S66
摘要	In situ tensile process of single-crystal Sn was investigated by transmission electron microscopy (TEM). Despite the traditional wedge microcrack, a new tetragonal microcrack was observed during crack propagation in the single-crystal Sn. During in situ tensile straining, the dislocation dipoles formed at the front of the wedge microcrack tip, the coalescence of which is the source of microvoids at the crack tip, and then the wedge microcrack propagated deeply by aggregation of discontinuous microvoids. The tetragonal microcrack propagated by the intersection along two vertical slip planes. Moreover, the series of high-resolution images showed that Sn islands formed at the center of the frontier crack plane due to the anisotropic self-diffusion of Sn atoms along different crystallographic planes.
部门归属	[shang, p. j.; liu, z. q.; li, d. x.; shang, j. k.] chinese acad sci, shenyang natl lab mat sci, inst met res, shenyang 110016, peoples r china. [shang, j. k.] univ illinois, dept mat sci & engn, urbana, il 61801 usa.;liu, zq (reprint author), chinese acad sci, shenyang natl lab mat sci, inst met res, shenyang 110016, peoples r china;zqliu@imr.ac.cn
关键词	In Situ Tem Straining Single Crystal Sn Slip System Self-diffusion Crack Propagation Free Solder Alloys Lead-free Solders Thermal Fatigue Behavior Creep Tin Pb Joints Ag Deformation
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WOS记录号	WOS:000280705200009
引用统计	被引频次：1[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	http://ir.imr.ac.cn/handle/321006/31426
专题	中国科学院金属研究所
推荐引用方式 GB/T 7714	P. J. Shang,Z. Q. Liu,D. X. Li,et al. Crack propagation of single crystal beta-Sn during in situ TEM straining[J]. Journal of Electron Microscopy,2010,59:S61-S66.
APA	P. J. Shang,Z. Q. Liu,D. X. Li,&J. K. Shang.(2010).Crack propagation of single crystal beta-Sn during in situ TEM straining.Journal of Electron Microscopy,59,S61-S66.
MLA	P. J. Shang,et al."Crack propagation of single crystal beta-Sn during in situ TEM straining".Journal of Electron Microscopy 59(2010):S61-S66.