Dislocations in charge-ordered Pr(0.5)Ca(0.5)MnO(3) epitaxial thin films prepared by a two-step growth technique

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	Dislocations in charge-ordered Pr(0.5)Ca(0.5)MnO(3) epitaxial thin films prepared by a two-step growth technique
	Y. L. Zhu; X. Wang; M. J. Zhuo; Y. Q. Zhang; X. L. Ma
	2010
发表期刊	Philosophical Magazine Letters
ISSN	0950-0839
卷号	90 期号:5 页码:323-336
摘要	Charge-ordered Pr(0.5)Ca(0.5)MnO(3) (PCMO) thin films epitaxially grown on SrTiO(3) (100) substrates were prepared by a two-step growth technique which resulted in a 10 nm thick first layer and a 70 nm thick main layer. The dislocations in the as-received films were investigated using conventional and high-resolution transmission electron microscopy. Pure-edge misfit dislocations with Burgers vectors a < 011 > and line directions < 100 > were found to be the major interfacial defects responsible for the full misfit relief in the PCMO films. These dislocations constitute a square grid of dislocation lines parallel to the PCMO/SrTiO(3) interface. In contrast, two types of dislocations were identified within the first layer. One is of edge type with Burgers vectors a < 110 > and line directions < 001 >; the other, of screw type with Burgers vectors a < 110 > and line directions < 110 >. Cross-slip of the latter may contribute to the multiplication of misfit dislocations necessary for a total misfit relaxation. Few threading dislocations were observed in the main layer. The dislocation configurations in the films are discussed in detail.
部门归属	[zhu, y. l.; wang, x.; zhuo, m. j.; zhang, y. q.; ma, x. l.] chinese acad sci, inst met res, shenyang natl lab mat sci, shenyang 110015, peoples r china.;zhu, yl (reprint author), chinese acad sci, inst met res, shenyang natl lab mat sci, shenyang 110015, peoples r china;ylzhu@imr.ac.cn
关键词	Dislocations Transmission Electron Microscopy Thin Films Perovskites Misfit Relaxation Mechanisms Moire Fringe Contrast Magnetic-field Domain Configurations Strain Srtio3 Interface Substrate Identification Accommodation
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文献类型	期刊论文
条目标识符	http://ir.imr.ac.cn/handle/321006/31800
专题	中国科学院金属研究所
推荐引用方式 GB/T 7714	Y. L. Zhu,X. Wang,M. J. Zhuo,et al. Dislocations in charge-ordered Pr(0.5)Ca(0.5)MnO(3) epitaxial thin films prepared by a two-step growth technique[J]. Philosophical Magazine Letters,2010,90(5):323-336.
APA	Y. L. Zhu,X. Wang,M. J. Zhuo,Y. Q. Zhang,&X. L. Ma.(2010).Dislocations in charge-ordered Pr(0.5)Ca(0.5)MnO(3) epitaxial thin films prepared by a two-step growth technique.Philosophical Magazine Letters,90(5),323-336.
MLA	Y. L. Zhu,et al."Dislocations in charge-ordered Pr(0.5)Ca(0.5)MnO(3) epitaxial thin films prepared by a two-step growth technique".Philosophical Magazine Letters 90.5(2010):323-336.