IMR OpenIR
Effects of aging time, strain rate and solder thickness on interfacial fracture behaviors of Sn-3Cu/Cu single crystal joints
H. F. Zou; Z. F. Zhang
2010
发表期刊Microelectronic Engineering
ISSN0167-9317
卷号87期号:4页码:601-609
摘要The effects of aging time, strain rate and solder thickness on fracture behaviors of Sn-3Cu/Cu single crystal joints were investigated. Experimental results showed that short aging time (less than 10 days) did not obviously affect the tensile strength and fracture behaviors of the solder joints. However, strain rate and solder thickness played significant roles in the strength and fracture behaviors of the solder joints. It was observed that these joints broke in a ductile manner at low strain rates with a rapid increase in the tensile strength, but displayed a brittle manner at high strain rates with a slow increase in the tensile strength. A model was proposed to explain such ductile-to-brittle transition between solder and intermetallic compounds. In addition, the solder joints broke in a ductile manner and presented a low tensile strength for the joints with thicker solder, but displayed a brittle manner and a higher tensile strength for the joints with thinner solder. (C) 2009 Elsevier B.V. All rights reserved.
部门归属[zou, h. f.; zhang, z. f.] chinese acad sci, inst met res, shenyang natl lab mat sci, shenyang 110016, peoples r china.;zhang, zf (reprint author), chinese acad sci, inst met res, shenyang natl lab mat sci, shenyang 110016, peoples r china;zhfzhang@imr.ac.cn
关键词Sn-cu Solder Interfacial Strength Intermetallic Compounds Ductile-to-brittle Transition Strain Rate Fracture Lead-free Solders Intermetallic Compounds Tensile Properties Microstructure Growth Alloy
URL查看原文
WOS记录号WOS:000275264200015
引用统计
被引频次:26[WOS]   [WOS记录]     [WOS相关记录]
文献类型期刊论文
条目标识符http://ir.imr.ac.cn/handle/321006/31807
专题中国科学院金属研究所
推荐引用方式
GB/T 7714
H. F. Zou,Z. F. Zhang. Effects of aging time, strain rate and solder thickness on interfacial fracture behaviors of Sn-3Cu/Cu single crystal joints[J]. Microelectronic Engineering,2010,87(4):601-609.
APA H. F. Zou,&Z. F. Zhang.(2010).Effects of aging time, strain rate and solder thickness on interfacial fracture behaviors of Sn-3Cu/Cu single crystal joints.Microelectronic Engineering,87(4),601-609.
MLA H. F. Zou,et al."Effects of aging time, strain rate and solder thickness on interfacial fracture behaviors of Sn-3Cu/Cu single crystal joints".Microelectronic Engineering 87.4(2010):601-609.
条目包含的文件
文件名称/大小 文献类型 版本类型 开放类型 使用许可
1575.pdf(1205KB) 开放获取--
个性服务
推荐该条目
保存到收藏夹
查看访问统计
导出为Endnote文件
谷歌学术
谷歌学术中相似的文章
[H. F. Zou]的文章
[Z. F. Zhang]的文章
百度学术
百度学术中相似的文章
[H. F. Zou]的文章
[Z. F. Zhang]的文章
必应学术
必应学术中相似的文章
[H. F. Zou]的文章
[Z. F. Zhang]的文章
相关权益政策
暂无数据
收藏/分享
所有评论 (0)
暂无评论
 

除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。