The mechanism of periodic layer formation during solid-state reaction between Mg and SiO(2)

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	The mechanism of periodic layer formation during solid-state reaction between Mg and SiO(2)
	Y. C. Chen; J. Xu; X. H. Fan; X. F. Zhang; L. Han; D. Y. Lin; Q. H. Li; C. Uher
	2009
发表期刊	Intermetallics
ISSN	0966-9795
卷号	17 期号:11 页码:920-926
摘要	The as yet unresolved microstructure of the periodic layers formed in the reactive diffusion system Mg/SiO(2) was clarified by using high-resolution field-emission SEM. The periodic layered structure actually consists of the single-phase layer of Mg(2)Si and the two-phase layer of (Mg(2)Si + MgO) alternated within the reaction zone. According to the experimental observations and in line with the diffusion-induced stresses model, the mechanism controlling this phenomenon could be attributed to the stresses induced by the difference in interface growth rates of Mg(2)Si and MgO phases within the layer. When the elastic deformation of the slow-growing aggregated-MgO phase reaches its elastic maximum, it will be split off from the reaction front by the neighboring Mg(2)Si phase and a new periodic layer forms. The computer simulation results are coinciding well with the experimental data. (C) 2009 Elsevier Ltd. All rights reserved.
部门归属	[chen, y. c.; zhang, x. f.; han, l.] chinese acad sci, inst elect engn, beijing 100190, peoples r china. [xu, j.] chinese acad sci, inst mat res, state key lab corros & protect, shenyang 110016, peoples r china. [fan, x. h.] univ sci & technol beijing, sch mat sci & engn, ctr corros & protect, beijing 100083, peoples r china. [uher, c.] univ michigan, dept phys, ann arbor, mi 48109 usa.;chen, yc (reprint author), chinese acad sci, inst elect engn, beijing 100190, peoples r china;matscichen@hotmail.com
关键词	Composites Based On The Intermetallics Matrix Nanostructured Intermetallics Diffusion Microstructure Thermoelectric Power Generation Diffusion Couples Rayleigh Instability Interdiffusion Interface System
URL	查看原文
文献类型	期刊论文
条目标识符	http://ir.imr.ac.cn/handle/321006/31838
专题	中国科学院金属研究所
推荐引用方式 GB/T 7714	Y. C. Chen,J. Xu,X. H. Fan,et al. The mechanism of periodic layer formation during solid-state reaction between Mg and SiO(2)[J]. Intermetallics,2009,17(11):920-926.
APA	Y. C. Chen.,J. Xu.,X. H. Fan.,X. F. Zhang.,L. Han.,...&C. Uher.(2009).The mechanism of periodic layer formation during solid-state reaction between Mg and SiO(2).Intermetallics,17(11),920-926.
MLA	Y. C. Chen,et al."The mechanism of periodic layer formation during solid-state reaction between Mg and SiO(2)".Intermetallics 17.11(2009):920-926.