| Impact of high interface density on ferroelectric and structural properties of PbZr(0.2)Ti(0.8)O(3)/PbZr(0.4)Ti(0.6)O(3) epitaxial multilayers | |
| L. Feigl; S. J. Zheng; B. I. Birajdar; B. J. Rodriguez; Y. L. Zhu; M. Alexe; D. Hesse | |
| 2009 | |
| Source Publication | Journal of Physics D-Applied Physics
 |
| ISSN | 0022-3727 |
| Volume | 42Issue:8 |
| Abstract | Multilayers consisting of two tetragonal compositions PbZr(0.2)Ti(0.8)O(3) and PbZr(0.4)Ti(0.6)O(3) were deposited onto a SrRuO(3) electrode grown on a vicinal (100) SrTiO(3) substrate. It has been shown by extensive structural investigations comprising transmission electron microscopy in conventional and high resolution mode, reciprocal space mapping and piezoresponse force microscopy that with decreasing layer thickness a transition from a-domains confined to individual layers to a-domains propagating through the whole film takes place. This is caused by the formation of a common strain state of all layers which is responsible for the observed enhancement of the electrical properties. These show a maximum in the product of remanent polarization and dielectric constant at a certain density of interfaces. If the interface density becomes too high the lattice distortion accompanying each interface deteriorates the properties of the multilayer structure. |
| description.department | [feigl, l.; birajdar, b. i.; rodriguez, b. j.; zhu, y. l.; alexe, m.; hesse, d.] max planck inst microstruct phys, d-06120 halle, germany. [zheng, s. j.; zhu, y. l.] chinese acad sci, inst met res, shenyang natl lab mat sci, shenyang 110016, peoples r china.;feigl, l (reprint author), max planck inst microstruct phys, weinberg 2, d-06120 halle, germany;lfeigl@mpi-halle.de |
| Keyword | Thin-films Dislocations Layer |
| URL | 查看原文 |
| Document Type | 期刊论文 |
| Identifier | http://ir.imr.ac.cn/handle/321006/31894 |
| Collection | 中国科学院金属研究所 |
| Recommended Citation GB/T 7714 | L. Feigl,S. J. Zheng,B. I. Birajdar,et al. Impact of high interface density on ferroelectric and structural properties of PbZr(0.2)Ti(0.8)O(3)/PbZr(0.4)Ti(0.6)O(3) epitaxial multilayers[J]. Journal of Physics D-Applied Physics,2009,42(8). |
| APA | L. Feigl.,S. J. Zheng.,B. I. Birajdar.,B. J. Rodriguez.,Y. L. Zhu.,...&D. Hesse.(2009).Impact of high interface density on ferroelectric and structural properties of PbZr(0.2)Ti(0.8)O(3)/PbZr(0.4)Ti(0.6)O(3) epitaxial multilayers.Journal of Physics D-Applied Physics,42(8). |
| MLA | L. Feigl,et al."Impact of high interface density on ferroelectric and structural properties of PbZr(0.2)Ti(0.8)O(3)/PbZr(0.4)Ti(0.6)O(3) epitaxial multilayers".Journal of Physics D-Applied Physics 42.8(2009). |
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