Dynamic hysteresis scaling of ferroelectric Pb(0.9)Ba(0.1)(Zr(0.52)Ti(0.48))O(3) thin films

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	Dynamic hysteresis scaling of ferroelectric Pb(0.9)Ba(0.1)(Zr(0.52)Ti(0.48))O(3) thin films
	Y. Y. Guo; T. Wei; Q. Y. He; J. M. Liu
	2009
发表期刊	Journal of Physics-Condensed Matter
ISSN	0953-8984
卷号	21 期号:48
摘要	We measure systematically the intrinsic scaling behavior of dynamic hysteresis for Pb(0.9)Ba(0.1)(Zr(0.52)Ti(0.48))O(3) (PBZT) ferroelectric thin films with Pt electrodes on Si substrates, utilizing the Sawyer-Tower technique. For the as-prepared thin films of similar thickness and microstructure, over the low frequency range, the scaling follows the power law < A > proportional to f(0.28)E(0)(0.91) under low E(0) and the power law < A > proportional to f(0.35)E(0)(0.78) under high E(0), where < A > is the hysteresis area, and f and E(0) are the frequency and amplitude of the external electric field. In the high-f range, the power law for low E0 takes the form of < A > proportional to f(-0.32)E(0)(3.2), while that for high E(0) takes the form of < A > proportional to f(-0.2)E(0)(2.2). It is identified that the dynamic behaviors at low frequency mainly come from the intrinsic domain reversal instead of others like the leakage current, while the depolarization field may influence the frequency exponents at high frequency. We study the temperature scaling of the hysteresis, indicating that the scaling under low E(0) is roughly consistent with the (Phi(2))(2) model. Finally, we argue that experimentally obtained power law scaling for Pb(Zr(0.52)Ti(0.48))O(3) thin films prepared under the given conditions may not be reliable due to the polarization fatigue effect.
部门归属	[guo, y. y.; wei, t.; liu, j-m] nanjing univ, solid state microstruct lab, nanjing 210093, peoples r china. [he, q. y.; liu, j-m] s china normal univ, sch phys, guangzhou 510006, guangdong, peoples r china. [liu, j-m] chinese acad sci, int ctr mat phys, shenyang, peoples r china.;liu, jm (reprint author), nanjing univ, solid state microstruct lab, nanjing 210093, peoples r china;liujm@nju.edu.cn
关键词	Depolarization-field Spin Systems Electrodes Fatigue Capacitors Behavior Model
URL	查看原文
文献类型	期刊论文
条目标识符	http://ir.imr.ac.cn/handle/321006/31941
专题	中国科学院金属研究所
推荐引用方式 GB/T 7714	Y. Y. Guo,T. Wei,Q. Y. He,et al. Dynamic hysteresis scaling of ferroelectric Pb(0.9)Ba(0.1)(Zr(0.52)Ti(0.48))O(3) thin films[J]. Journal of Physics-Condensed Matter,2009,21(48).
APA	Y. Y. Guo,T. Wei,Q. Y. He,&J. M. Liu.(2009).Dynamic hysteresis scaling of ferroelectric Pb(0.9)Ba(0.1)(Zr(0.52)Ti(0.48))O(3) thin films.Journal of Physics-Condensed Matter,21(48).
MLA	Y. Y. Guo,et al."Dynamic hysteresis scaling of ferroelectric Pb(0.9)Ba(0.1)(Zr(0.52)Ti(0.48))O(3) thin films".Journal of Physics-Condensed Matter 21.48(2009).