Low-temperature instability of Ti(2)SnC: A combined transmission electron microscopy, differential scanning calorimetry, and x-ray diffraction investigations

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	Low-temperature instability of Ti(2)SnC: A combined transmission electron microscopy, differential scanning calorimetry, and x-ray diffraction investigations
	J. Zhang; B. Liu; J. Y. Wang; Y. C. Zhou
	2009
发表期刊	Journal of Materials Research
ISSN	0884-2914
卷号	24 期号:1 页码:39-49
摘要	Transmission electron microscopy (TEM), differential scanning calorimetry (DSC), and x-ray diffraction (XRD) investigations were conducted oil the hot-pressed Ti(2)SnC bulk ceramic. Microstructure features of bulk Ti(2)SnC ceramic were characterized by using TEM, and a needle-shaped beta-Sn precipitation was observed inside Ti(2)SnC grains with the orientation relationship: (0001) Ti(2)SnC // (200) Sn and [1 (2) over bar 10] Ti(2)SnC // [001] Sn. With the combination of DSC and XRD analyses, the precipitation of metallic Sri was demonstrated to be a thermal stress-induced process during the cooling procedure. The reheating temperature, even as low as 400 degrees C, Could trigger the precipitation of Sn from Ti(2)SnC, which indicated the low-temperature instability of Ti(2)SnC. A substoichiometry Ti(2)Sn(x)C formed after depiction of Sn from ternary Ti(2)SnC phase. Under electron beam irradiation, metallic Sri was observed diffusing back into Ti(2)Sn(x)C. Furthermore, a new Ti(7)SnC(6) phase with the lattice constants of a = 0.32 and c = 4.1 nm was identified and added in the Ti-Sn-C ternary system.
部门归属	[zhang, j.; liu, b.; wang, j. y.; zhou, y. c.] chinese acad sci, inst met res, shenyang natl lab mat sci, shenyang 110016, peoples r china. [zhang, j.; liu, b.] chinese acad sci, grad sch, beijing 100039, peoples r china.;zhou, yc (reprint author), chinese acad sci, inst met res, shenyang natl lab mat sci, shenyang 110016, peoples r china;yczhou@imr.ac.cn
关键词	Liquid Reaction Synthesis Thin-films Oxidation Behavior Thermal-stability Phase-stability Whisker Growth M2snc m Ti3sic2 Ti2alc Al
URL	查看原文
WOS记录号	WOS:000267207500006
引用统计	被引频次：87[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	http://ir.imr.ac.cn/handle/321006/32546
专题	中国科学院金属研究所
推荐引用方式 GB/T 7714	J. Zhang,B. Liu,J. Y. Wang,et al. Low-temperature instability of Ti(2)SnC: A combined transmission electron microscopy, differential scanning calorimetry, and x-ray diffraction investigations[J]. Journal of Materials Research,2009,24(1):39-49.
APA	J. Zhang,B. Liu,J. Y. Wang,&Y. C. Zhou.(2009).Low-temperature instability of Ti(2)SnC: A combined transmission electron microscopy, differential scanning calorimetry, and x-ray diffraction investigations.Journal of Materials Research,24(1),39-49.
MLA	J. Zhang,et al."Low-temperature instability of Ti(2)SnC: A combined transmission electron microscopy, differential scanning calorimetry, and x-ray diffraction investigations".Journal of Materials Research 24.1(2009):39-49.