Characterization of oxygen vacancies and their migration in Ba-doped Pb(Zr(0.52)Ti(0.48))O(3) ferroelectrics

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	Characterization of oxygen vacancies and their migration in Ba-doped Pb(Zr(0.52)Ti(0.48))O(3) ferroelectrics
	M. F. Zhang; Y. Wang; K. F. Wang; J. S. Zhu; J. M. Liu
	2009
发表期刊	Journal of Applied Physics
ISSN	0021-8979
卷号	105 期号:6
摘要	We investigate in detail the migration kinetics of oxygen vacancies (OVs) in Ba-doped Pb(Zr(0.52)Ti(0.48))O(3) (PZT) ferroelectrics by complex impedance spectroscopy. The temperature dependent dc-electrical conductivity sigma(dc) suggests that Ba doping into PZT can lower significantly the density of OVs, leading to the distinctly decreased sigma(dc) and slightly enhanced activation energy U for the migration of OVs, thus benefiting the polarization fatigue resistance. Furthermore, the polarization fluctuation induced by the relaxation of OVs is reduced by the Ba doping. The Cole-Cole fitting to the dielectric loss manifests strong correlation among OVs, and the migration of OVs appears to be a collective behavior.
部门归属	[zhang, m. f.; wang, y.; wang, k. f.; zhu, j. s.; liu, j. -m.] nanjing univ, solid state microstruct lab, nanjing 210093, peoples r china. [zhang, m. f.] harbin inst technol, ctr composite mat, harbin 150001, peoples r china. [wang, y.; wang, k. f.; zhu, j. s.; liu, j. -m.] chinese acad sci, int ctr mat phys, shenyang 110016, peoples r china.;liu, jm (reprint author), nanjing univ, solid state microstruct lab, nanjing 210093, peoples r china;liujm@nju.edu.cn
关键词	Barium Dielectric Losses Dielectric Polarisation Dielectric Relaxation Doping Profiles Electrical Conductivity Ferroelectric Ceramics Ferroelectric Thin Films Fluctuations Lead Compounds Vacancies (Crystal) Lead-zirconate-titanate Thin-films Dielectric Characterization Single-crystal Fatigue Electrodes Capacitors Ceramics
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文献类型	期刊论文
条目标识符	http://ir.imr.ac.cn/handle/321006/32555
专题	中国科学院金属研究所
推荐引用方式 GB/T 7714	M. F. Zhang,Y. Wang,K. F. Wang,et al. Characterization of oxygen vacancies and their migration in Ba-doped Pb(Zr(0.52)Ti(0.48))O(3) ferroelectrics[J]. Journal of Applied Physics,2009,105(6).
APA	M. F. Zhang,Y. Wang,K. F. Wang,J. S. Zhu,&J. M. Liu.(2009).Characterization of oxygen vacancies and their migration in Ba-doped Pb(Zr(0.52)Ti(0.48))O(3) ferroelectrics.Journal of Applied Physics,105(6).
MLA	M. F. Zhang,et al."Characterization of oxygen vacancies and their migration in Ba-doped Pb(Zr(0.52)Ti(0.48))O(3) ferroelectrics".Journal of Applied Physics 105.6(2009).