Microstructural stability of a single crystal superalloy DD8 during thermal exposure | |
K. Y. Cheng; D. H. Kim; Y. S. Yoo; C. Y. Jo; T. Jin; Z. Q. Hu | |
2008 | |
发表期刊 | Journal of Materials Science & Technology
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ISSN | 1005-0302 |
卷号 | 24期号:1页码:127-130 |
摘要 | Microstructural stability of a nickel base single crystal alloy DD8 has been investigated. Standard heat treated specimen showed good microstructural stability at 950 degrees C. While under the as-cast condition, a kind of rod-like phase precipitated in the interdendritic region of as-cast specimen during thermal exposure. The phase, which has bcc structure, was enriched with Cr. Thermo-calc also predicted precipitation of a bcc phase at around 950 degrees C. The Cr-rich bcc phase was considered as alpha-Cr and formed due to the segregation of Cr under the as-cast condition. |
部门归属 | [kim, d. h.] kims, mat test & characterizat grp, chang won, south korea. [cheng, k. y.; jin, t.; hu, z. q.] chinese acad sci, inst met res, superalloy div, shenyang 110016, peoples r china. [cheng, k. y.; yoo, y. s.; jo, c. y.] kims, high temp mat grp, chang won, south korea.;kim, dh (reprint author), kims, mat test & characterizat grp, chang won, south korea;kdhl644@kims.re.kr |
关键词 | Dd-8 Single Crystal Alloy Microstructural Stability Alpha Chromium Nickel-base Superalloy Fatigue |
URL | 查看原文 |
WOS记录号 | WOS:000253208300032 |
引用统计 | |
文献类型 | 期刊论文 |
条目标识符 | http://ir.imr.ac.cn/handle/321006/32688 |
专题 | 中国科学院金属研究所 |
推荐引用方式 GB/T 7714 | K. Y. Cheng,D. H. Kim,Y. S. Yoo,et al. Microstructural stability of a single crystal superalloy DD8 during thermal exposure[J]. Journal of Materials Science & Technology,2008,24(1):127-130. |
APA | K. Y. Cheng,D. H. Kim,Y. S. Yoo,C. Y. Jo,T. Jin,&Z. Q. Hu.(2008).Microstructural stability of a single crystal superalloy DD8 during thermal exposure.Journal of Materials Science & Technology,24(1),127-130. |
MLA | K. Y. Cheng,et al."Microstructural stability of a single crystal superalloy DD8 during thermal exposure".Journal of Materials Science & Technology 24.1(2008):127-130. |
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