Combined effects of crystallographic orientation, stacking fault energy and grain size on deformation twinning in fcc crystals

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	Combined effects of crystallographic orientation, stacking fault energy and grain size on deformation twinning in fcc crystals; Combined effects of crystallographic orientation, stacking fault energy and grain size on deformation twinning in fcc crystals
	W. Z. Han; Z. F. Zhang; S. D. Wu; S. X. Li
	2008 ; 2008
发表期刊	Philosophical Magazine ; Philosophical Magazine
ISSN	1478-6435 ; 1478-6435
卷号	88 期号:24 页码:3011-3029
摘要	The combined effects of crystallographic orientation, stacking fault energy (SFE) and grain size on deformation twinning behavior in several face-centred cubic (fcc) crystals were investigated experimentally and analytically. Three types of fcc crystals, Al single crystals, Cu single crystals and polycrystalline Cu-3% Si alloy with different SFEs and special crystallographic orientations, were selected. The orientations of the Al and Cu single crystals were designed with one of the twinning systems [image omitted] just perpendicular to the intersection plane of equal-channel angular pressing (ECAP). For Al single crystals, no deformation twins were observed after a one-pass ECAP, although a preferential crystallographic orientation was selected for twinning. For Cu single crystals, numerous deformation twins were found even when strained at room temperature and at low strain rate. For Cu-3% Si alloy, deformation twins were only observed in some grains; however, others with different orientations were full of dislocations, although it has the lowest SFE value of the three fcc crystal types. The experimental results provide evidence that SFE and crystallographic orientation have a remarkable influence on the behavior of deformation twinning in fcc crystals. The observations were subsequently analyzed based on fundamental dislocation mechanisms and the grain-size effect. The deformation conditions required for twinning and the variation in twinning stress with SFE, crystallographic orientation and grain size in fcc crystals are also discussed.; The combined effects of crystallographic orientation, stacking fault energy (SFE) and grain size on deformation twinning behavior in several face-centred cubic (fcc) crystals were investigated experimentally and analytically. Three types of fcc crystals, Al single crystals, Cu single crystals and polycrystalline Cu-3% Si alloy with different SFEs and special crystallographic orientations, were selected. The orientations of the Al and Cu single crystals were designed with one of the twinning systems [image omitted] just perpendicular to the intersection plane of equal-channel angular pressing (ECAP). For Al single crystals, no deformation twins were observed after a one-pass ECAP, although a preferential crystallographic orientation was selected for twinning. For Cu single crystals, numerous deformation twins were found even when strained at room temperature and at low strain rate. For Cu-3% Si alloy, deformation twins were only observed in some grains; however, others with different orientations were full of dislocations, although it has the lowest SFE value of the three fcc crystal types. The experimental results provide evidence that SFE and crystallographic orientation have a remarkable influence on the behavior of deformation twinning in fcc crystals. The observations were subsequently analyzed based on fundamental dislocation mechanisms and the grain-size effect. The deformation conditions required for twinning and the variation in twinning stress with SFE, crystallographic orientation and grain size in fcc crystals are also discussed.
部门归属	[han, w. z.; zhang, z. f.; wu, s. d.; li, s. x.] chinese acad sci, inst met res, shenyang natl lab mat sci, shenyang, peoples r china.;han, wz (reprint author), chinese acad sci, inst met res, shenyang natl lab mat sci, shenyang, peoples r china;wzhan@imr.ac.cn shdwu@imr.ac.cn ; [han, w. z.; zhang, z. f.; wu, s. d.; li, s. x.] chinese acad sci, inst met res, shenyang natl lab mat sci, shenyang, peoples r china.;han, wz (reprint author), chinese acad sci, inst met res, shenyang natl lab mat sci, shenyang, peoples r china;wzhan@imr.ac.cn shdwu@imr.ac.cn
关键词	Equal Channel Angular Pressing (Ecap) Equal Channel Angular Pressing (Ecap) Deformation Twin Deformation Twin Fcc Crystal Fcc Crystal Stacking Fault Energy Stacking Fault Energy Grain Size Grain Size Copper Single-crystals Copper Single-crystals Molecular-dynamics Simulation Molecular-dynamics Simulation Low Strain-rate Low Strain-rate Room-temperature Room-temperature NanocrystAlline Al NanocrystAlline Al Substructure Development Substructure Development Plastic-deformation Plastic-deformation Texture Development Texture Development Alloys Alloys Cu Cu
URL	查看原文 ; 查看原文
WOS记录号	WOS:000261299400002 ; WOS:000261299400002
引用统计	被引频次：106[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	http://ir.imr.ac.cn/handle/321006/32794
专题	中国科学院金属研究所
推荐引用方式 GB/T 7714	W. Z. Han,Z. F. Zhang,S. D. Wu,et al. Combined effects of crystallographic orientation, stacking fault energy and grain size on deformation twinning in fcc crystals, Combined effects of crystallographic orientation, stacking fault energy and grain size on deformation twinning in fcc crystals[J]. Philosophical Magazine, Philosophical Magazine,2008, 2008,88, 88(24):3011-3029, 3011-3029.
APA	W. Z. Han,Z. F. Zhang,S. D. Wu,&S. X. Li.(2008).Combined effects of crystallographic orientation, stacking fault energy and grain size on deformation twinning in fcc crystals.Philosophical Magazine,88(24),3011-3029.
MLA	W. Z. Han,et al."Combined effects of crystallographic orientation, stacking fault energy and grain size on deformation twinning in fcc crystals".Philosophical Magazine 88.24(2008):3011-3029.