Microstructure and microanalysis of BaNb(0.2)Ti(0.8)O(3) thin film | |
M. Zhang; X. L. Ma; D. X. Li; S. J. Xie; R. P. H. Chang | |
2008 | |
发表期刊 | Materials Chemistry and Physics
![]() |
ISSN | 0254-0584 |
卷号 | 112期号:3页码:756-761 |
摘要 | Perovskite-based BaNb(0.2)Ti(0.8)O(3) (BNTO) thin film, grown by computer-controlled laser molecular beam epitaxy on SrTiO(3) (001) substrate, was investigated by means of high-resolution electron microscopic (HREM) imaging, high-angle annular dark-field (HAADF) imaging, and X-ray energy dispersive spectrometric (XEDS) line-scanning in a transmission electron microscope. The microstructure of the BaNb(0.2)Ti(0.8)O(3) film is clarified in terms of various domains due to tetragonal characteristics. Compositional fluctuation was observed in the various domains and domain boundaries. The misfit strain and element diffusivity during the film growth together with inherent tetragonal characteristics are discussed as a possible mechanism for the formation and distribution of various domains. (C) 2008 Elsevier B.V. All rights reserved. |
部门归属 | [zhang, m.; xie, s. j.; chang, r. p. h.] northwestern univ, dept mat sci & engn, evanston, il 60208 usa. [zhang, m.; ma, x. l.; li, d. x.] chinese acad sci, inst met res, shenyang natl lab mat sci, shenyang 110016, peoples r china. [xie, s. j.; chang, r. p. h.] northwestern univ, inst mat res, evanston, il 60208 usa.;zhang, m (reprint author), northwestern univ, dept mat sci & engn, 2220 campus dr, evanston, il 60208 usa;ming-zhang@northwestern.edu |
关键词 | Microstructure Characterization Transmission Electron Microscopy Interface Structure Defects Orientation Relationship Perovskite Thin Films Chemical-vapor-deposition Molecular-beam Epitaxy Crystal-structure Batio3 Magnetoresistance Nb Yba2cu3o7-x Oxide |
URL | 查看原文 |
文献类型 | 期刊论文 |
条目标识符 | http://ir.imr.ac.cn/handle/321006/33328 |
专题 | 中国科学院金属研究所 |
推荐引用方式 GB/T 7714 | M. Zhang,X. L. Ma,D. X. Li,et al. Microstructure and microanalysis of BaNb(0.2)Ti(0.8)O(3) thin film[J]. Materials Chemistry and Physics,2008,112(3):756-761. |
APA | M. Zhang,X. L. Ma,D. X. Li,S. J. Xie,&R. P. H. Chang.(2008).Microstructure and microanalysis of BaNb(0.2)Ti(0.8)O(3) thin film.Materials Chemistry and Physics,112(3),756-761. |
MLA | M. Zhang,et al."Microstructure and microanalysis of BaNb(0.2)Ti(0.8)O(3) thin film".Materials Chemistry and Physics 112.3(2008):756-761. |
条目包含的文件 | ||||||
文件名称/大小 | 文献类型 | 版本类型 | 开放类型 | 使用许可 | ||
682.pdf(1143KB) | 开放获取 | -- |
除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。
修改评论