Predicting remnant lifetime of high-temperature materials by a resistance degradation model

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	Predicting remnant lifetime of high-temperature materials by a resistance degradation model
	Y. W. Bao; Y. F. Han; Y. C. Zhou
	2007
发表期刊	Materials at High Temperatures
ISSN	0960-3409
卷号	24 期号:4 页码:303-306
摘要	Lifetime and remnant life of engineering materials at high temperature has been analyzed based on a resistance degradation model. It can be demonstrated that the lifetime includes two time processes: resistance degradation process before crack initiation and crack growth process after the crack initiation. Traditional lifetime prediction, via the crack growth model, was found to involve the paradox that the lifetime is in proportion to the initial crack size. Whereas, experiments of static fatigue using glass sheet specimens did not confirm this proportional relationship. For a smooth sample, fracture resistance depends on the strength of the material, so a strength degradation model was used to estimate the lifetime zone between an upper and lower bound. It is defined that the material fails when the residual strength decline to the working stress or deformation reaches a designed limit. It is concluded that the quantity of lifetime mainly depends on the rate of resistance degradation for a brittle component under applied load. Thus, lifetime prediction is simulated as a simple relationship between distance, rate and time, in which the distance is known, the rate can be obtained from experiments and then the lifetime can be calculated.
部门归属	[bao, yiwang; han, yanfei] china bldg mat acad, beijing 100024, peoples r china. [bao, yiwang; zhou, yanchun] shenyang natl lab mat sci, shenyang 110016, peoples r china.;bao, yw (reprint author), china bldg mat acad, beijing 100024, peoples r china
关键词	Remnant Lifetime a Resistance Degradation Model
URL	查看原文
文献类型	期刊论文
条目标识符	http://ir.imr.ac.cn/handle/321006/33425
专题	中国科学院金属研究所
推荐引用方式 GB/T 7714	Y. W. Bao,Y. F. Han,Y. C. Zhou. Predicting remnant lifetime of high-temperature materials by a resistance degradation model[J]. Materials at High Temperatures,2007,24(4):303-306.
APA	Y. W. Bao,Y. F. Han,&Y. C. Zhou.(2007).Predicting remnant lifetime of high-temperature materials by a resistance degradation model.Materials at High Temperatures,24(4),303-306.
MLA	Y. W. Bao,et al."Predicting remnant lifetime of high-temperature materials by a resistance degradation model".Materials at High Temperatures 24.4(2007):303-306.