Investigation on reliability of nanolayer-grained Ti3SiC2 via Weibull statistics

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	Investigation on reliability of nanolayer-grained Ti3SiC2 via Weibull statistics
	Y. W. Bao; Y. C. Zhou; H. B. Zhang
	2007
发表期刊	Journal of Materials Science
ISSN	0022-2461
卷号	42 期号:12 页码:4470-4475
摘要	Weibull modulus of bending strength of nanolayer-grained ceramic Ti3SiC2 was estimated with over 50 specimens, using the least square method, the moment method and the maximum likelihood technique, respectively. The result demonstrated that the m-value of this layered ceramic ranged from 25 to 29, which is much higher than that of traditional brittle ceramics. The reason of high Weibull modulus was due to high damage tolerance of this material. Under stress, delamination and kinking of grains and shear slipping at interfaces give this material high capacity of local energy dissipation and easy local stress relaxation, leading to the excellent damage tolerance of Ti3SiC2. The effect of amounts of specimens on the reliability of the estimated m-values was also investigated. It was confirmed that the stability of the estimated m-value increased with increasing numbers of specimens. The parameter obtained using the maximum likelihood technique showed the highest reliability than other methods. The ranges of failure probability were determined using the Weibull estimates calculated from the maximum likelihood technique.
部门归属	china bldg mat acad, beijing 100024, peoples r china. chinese acad sci, inst met res, shenyang natl lab mat sci, shenyang 110016, peoples r china.;bao, yw (reprint author), china bldg mat acad, beijing 100024, peoples r china;ywbao@csgc.org.cn
关键词	Ceramics Modulus Ti3alc2 Microstructure Indentations Strength
URL	查看原文
WOS记录号	WOS:000247402300043
引用统计	被引频次：26[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	http://ir.imr.ac.cn/handle/321006/33427
专题	中国科学院金属研究所
推荐引用方式 GB/T 7714	Y. W. Bao,Y. C. Zhou,H. B. Zhang. Investigation on reliability of nanolayer-grained Ti3SiC2 via Weibull statistics[J]. Journal of Materials Science,2007,42(12):4470-4475.
APA	Y. W. Bao,Y. C. Zhou,&H. B. Zhang.(2007).Investigation on reliability of nanolayer-grained Ti3SiC2 via Weibull statistics.Journal of Materials Science,42(12),4470-4475.
MLA	Y. W. Bao,et al."Investigation on reliability of nanolayer-grained Ti3SiC2 via Weibull statistics".Journal of Materials Science 42.12(2007):4470-4475.