Microstructural characteristics in the (BaSrNb0.3TiO3)-O-0.7 thin film, grown on SrTi03 substrate by computer-controlled laser molecular beam epitaxy, were characterized by means of transmission electron microscopy (TEM). It is found that the film is single-crystallized and epitaxially grown on the SrTiO3 substrate forming a flat and distinct interface. Anti-phase domains were identified, and the crystallographic features of mismatch dislocations at the interface between film and substrate were clarified. The high conductivity of the present film was discussed from the viewpoint of Nb dopant and the nitrogen atmosphere.
部门归属
chinese acad sci, inst met res, shenyang natl lab mat sci, shenyang 110016, peoples r china.;ma, xl (reprint author), chinese acad sci, inst met res, shenyang natl lab mat sci, shenyang 110016, peoples r china;xlma@imr.ac.cn
L. N. Cheng,X. L. Ma. Microstructural characteristics of epitaxial BaSrNb0.3Ti0.7O3 film[J]. Journal of Materials Science & Technology,2007,23(4):517-520.
APA
L. N. Cheng,&X. L. Ma.(2007).Microstructural characteristics of epitaxial BaSrNb0.3Ti0.7O3 film.Journal of Materials Science & Technology,23(4),517-520.
MLA
L. N. Cheng,et al."Microstructural characteristics of epitaxial BaSrNb0.3Ti0.7O3 film".Journal of Materials Science & Technology 23.4(2007):517-520.
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