Large-deformation analysis in microscopic area using micro-moire methods with a focused ion beam milling grating

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	Large-deformation analysis in microscopic area using micro-moire methods with a focused ion beam milling grating
	H. Du; H. M. Xie; Z. L. Guo; B. Pan; Q. Luo; C. Z. Gu; H. C. Jiang; L. J. Rong
	2007
发表期刊	Optics and Lasers in Engineering
ISSN	0143-8166
卷号	45 期号:12 页码:1157-1169
摘要	In this study, the focused ion beam (FIB) milling method is applied to fabricate sub-micron grating on TiNi shape memory alloy materials. With self-made FIB milling gratings, scanning electron microscope (SEM) micro-moire and digital moire methods are successfully used to measure large deformation of porous TiNi shape memory alloys (SMA) in uni-axial compressive tests. The principles of the SEM micro-moire method and digital moire method are introduced, and applied to calculate large strain. The full field deformation around shear bands can be measured precisely. During the investigation, the phenomenon of furcated moire fringes was found, and a corresponding explanation is given in this paper. The furcated fringes are generated in the locations of combined shear bands where sudden changes of strain occur. Successful results also verify that the FIB milling gratings are suitable for micro-moire measurement and can generate high quality moire fringes. (C) 2007 Elsevier Ltd. All rights reserved.
部门归属	tsing hua univ, dept engn mech, beijing 100084, peoples r china. chinese acad sci, inst phys, beijing 100081, peoples r china. chinese acad sci, inst met res, shenyang 110016, peoples r china.;xie, hm (reprint author), tsing hua univ, dept engn mech, beijing 100084, peoples r china, peoples r china;xiehm@mail.tsinghua.edu.cn
关键词	Sem Moire Digital Moire Fib Milling Grating Large-deformation Measurement Shear Band Shape-memory Alloy Automatic Fringe Analysis Stress-strain Behavior Tini Interferometry Fabrication Algorithm Powders
URL	查看原文
WOS记录号	WOS:000250327200006
引用统计	被引频次：14[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	http://ir.imr.ac.cn/handle/321006/33499
专题	中国科学院金属研究所
推荐引用方式 GB/T 7714	H. Du,H. M. Xie,Z. L. Guo,et al. Large-deformation analysis in microscopic area using micro-moire methods with a focused ion beam milling grating[J]. Optics and Lasers in Engineering,2007,45(12):1157-1169.
APA	H. Du.,H. M. Xie.,Z. L. Guo.,B. Pan.,Q. Luo.,...&L. J. Rong.(2007).Large-deformation analysis in microscopic area using micro-moire methods with a focused ion beam milling grating.Optics and Lasers in Engineering,45(12),1157-1169.
MLA	H. Du,et al."Large-deformation analysis in microscopic area using micro-moire methods with a focused ion beam milling grating".Optics and Lasers in Engineering 45.12(2007):1157-1169.