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Magnetoelectric CoFe2O4-Pb(Zr0.52Ti0.48)O-3 composite films prepared by pulsed-laser deposit method
Z. Y. Li; J. G. Wan; X. W. Wang; Y. Wang; J. S. Zhu; G. H. Wang; J. M. Liu
2007
发表期刊Integrated Ferroelectrics
ISSN1058-4587
卷号87页码:33-41
摘要We report the magnetoelectric CoFe2O4-Pb(Zr0.52T0.48)O-3 composite nanofilms prepared by pulse laser deposition method. X-ray diffraction and scanning electron microscopy were used to characterize the phase structures and morphologies of the films. Superconducting quantum interference device magnetometer, impedance analyzer, ferroelectric test unit and magnetoelectric measuring device were used to measure the magnetic, dielectric and ferroelectric, properties, as well as the magnetoelectric effect of the films. It is shown that the films possess good dielectric, ferroelectric and magnetic properties. The films exhibit magnetoelectric coupling properties similar to the bulk composites. The magnetoelectric effect of the films were studied in detail.
部门归属nanjing univ, dept phys, natl lab solid state microstruct, nanjing 210093, peoples r china. chinese acad sci, int ctr mat phys, shenyang, peoples r china.;wan, jg (reprint author), nanjing univ, dept phys, natl lab solid state microstruct, nanjing 210093, peoples r china;wanjg@nju.edu.cn
关键词Multiferroic Magnetoelectric Film Ferroelectric Magnetostriction Batio3-cofe2o4 Nanostructures
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WOS记录号WOS:000246302700005
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被引频次:10[WOS]   [WOS记录]     [WOS相关记录]
文献类型期刊论文
条目标识符http://ir.imr.ac.cn/handle/321006/33672
专题中国科学院金属研究所
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GB/T 7714
Z. Y. Li,J. G. Wan,X. W. Wang,et al. Magnetoelectric CoFe2O4-Pb(Zr0.52Ti0.48)O-3 composite films prepared by pulsed-laser deposit method[J]. Integrated Ferroelectrics,2007,87:33-41.
APA Z. Y. Li.,J. G. Wan.,X. W. Wang.,Y. Wang.,J. S. Zhu.,...&J. M. Liu.(2007).Magnetoelectric CoFe2O4-Pb(Zr0.52Ti0.48)O-3 composite films prepared by pulsed-laser deposit method.Integrated Ferroelectrics,87,33-41.
MLA Z. Y. Li,et al."Magnetoelectric CoFe2O4-Pb(Zr0.52Ti0.48)O-3 composite films prepared by pulsed-laser deposit method".Integrated Ferroelectrics 87(2007):33-41.
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