| Nanoindentation of lead-free solders in microelectronic packaging; Nanoindentation of lead-free solders in microelectronic packaging |
| C. Z. Liu; J. Chen
|
| 2007
; 2007
|
发表期刊 | Materials Science and Engineering a-Structural Materials Properties Microstructure and Processing
; Materials Science and Engineering a-Structural Materials Properties Microstructure and Processing
 |
ISSN | 0921-5093
; 0921-5093
|
卷号 | 448期号:1-2页码:340-344 |
摘要 | Lead-free eutectic SnBi and SnAgCu solder alloys were studied by nanoindenter. Eutectic SnPb solder was also examined for comparative purpose. Their mechanical properties including hardness, reduced modulus and creep rate sensitivity coefficient m values were obtained. It was found that eutectic SnAgCu solder is stiffer than both eutectic SnBi solder and SnPb solder, while eutectic SnBi is the hardest among these solder alloys. For eutectic SnAgCu alloy, its m value obtained by nanoindenter was in excellent agreement with that by uniaxial tensile test. Both lead-free solders showed more creep resistance than eutectic SnPb solder. Nanoindenter is a useful way to characterize the small sized materials of electronic components. (c) 2006 Elsevier B.V. All rights reserved.; Lead-free eutectic SnBi and SnAgCu solder alloys were studied by nanoindenter. Eutectic SnPb solder was also examined for comparative purpose. Their mechanical properties including hardness, reduced modulus and creep rate sensitivity coefficient m values were obtained. It was found that eutectic SnAgCu solder is stiffer than both eutectic SnBi solder and SnPb solder, while eutectic SnBi is the hardest among these solder alloys. For eutectic SnAgCu alloy, its m value obtained by nanoindenter was in excellent agreement with that by uniaxial tensile test. Both lead-free solders showed more creep resistance than eutectic SnPb solder. Nanoindenter is a useful way to characterize the small sized materials of electronic components. (c) 2006 Elsevier B.V. All rights reserved. |
部门归属 | shenyang inst aeronaut engn, dept mat engn, shenyang 110034, peoples r china. chinese acad sci, inst met res, shenyang 110016, peoples r china.;liu, cz (reprint author), shenyang inst aeronaut engn, dept mat engn, shenyang 110034, peoples r china;chunzliu@yahoo.com
; shenyang inst aeronaut engn, dept mat engn, shenyang 110034, peoples r china. chinese acad sci, inst met res, shenyang 110016, peoples r china.;liu, cz (reprint author), shenyang inst aeronaut engn, dept mat engn, shenyang 110034, peoples r china;chunzliu@yahoo.com
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关键词 | Solder
Solder
Nanoindentation
Nanoindentation
Hardness
Hardness
Modulus
Modulus
Creep
Creep
Creep
Creep
Microstructure
Microstructure
Indentation
Indentation
Alloys
Alloys
Behavior
Behavior
Joints
Joints
|
URL | 查看原文
; 查看原文
|
WOS记录号 | WOS:000244791100048
; WOS:000244791100048
|
引用统计 |
|
文献类型 | 期刊论文
|
条目标识符 | http://ir.imr.ac.cn/handle/321006/33690
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专题 | 中国科学院金属研究所
|
推荐引用方式 GB/T 7714 |
C. Z. Liu,J. Chen. Nanoindentation of lead-free solders in microelectronic packaging, Nanoindentation of lead-free solders in microelectronic packaging[J]. Materials Science and Engineering a-Structural Materials Properties Microstructure and Processing, Materials Science and Engineering a-Structural Materials Properties Microstructure and Processing,2007, 2007,448, 448(1-2):340-344, 340-344.
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APA |
C. Z. Liu,&J. Chen.(2007).Nanoindentation of lead-free solders in microelectronic packaging.Materials Science and Engineering a-Structural Materials Properties Microstructure and Processing,448(1-2),340-344.
|
MLA |
C. Z. Liu,et al."Nanoindentation of lead-free solders in microelectronic packaging".Materials Science and Engineering a-Structural Materials Properties Microstructure and Processing 448.1-2(2007):340-344.
|
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