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Identification of interfacial and bulk effects in modulating fatigue behaviors of Pb(Zr0.52Ti0.48)O-3 thin films
Y. Wang; F. Yuan; T. Wei; C. Zhu; K. F. Wang; Y. D. Xia; J. M. Liu
2007
发表期刊Journal of Applied Physics
ISSN0021-8979
卷号101期号:1
摘要The polarization fatigue behaviors of Pt/LaNiO3/Pb(Zr0.52Ti0.48)O-3/LaNiO3/Pt (Pt/LNO/PZT/LNO/Pt) and Pt/PZT/Pt structures under different temperatures T, voltages V-amp, and frequencies f are investigated in order to clarify defect-related interfacial and bulk effects. The fatigue endurance of the Pt/LNO/PZT/LNO/Pt structure is enhanced at higher T, larger V-amp, and lower f, whereas for the Pt/PZT/Pt structure a better antifatigue performance is obtained at lower T, smaller V-amp, and higher f. The defect chemistry as one of the origins of the switching fatigue is demonstrated by the predominant interfacial effect and bulk effect resulting in two types of markedly opposite fatigue responses. (c) 2007 American Institute of Physics.
部门归属nanjing univ, nanjing natl lab microstruct, nanjing 210093, peoples r china. chinese acad sci, int ctr mat phys, shenyang 110016, peoples r china.;wang, y (reprint author), nanjing univ, nanjing natl lab microstruct, nanjing 210093, peoples r china;wangyangnju@gmail.com
关键词Ferroelectric Capacitors Polarization Fatigue Srbi2ta2o9 Electrodes Charge Scenarios Memories Model Layer
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WOS记录号WOS:000243585200131
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被引频次:9[WOS]   [WOS记录]     [WOS相关记录]
文献类型期刊论文
条目标识符http://ir.imr.ac.cn/handle/321006/33882
专题中国科学院金属研究所
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Y. Wang,F. Yuan,T. Wei,et al. Identification of interfacial and bulk effects in modulating fatigue behaviors of Pb(Zr0.52Ti0.48)O-3 thin films[J]. Journal of Applied Physics,2007,101(1).
APA Y. Wang.,F. Yuan.,T. Wei.,C. Zhu.,K. F. Wang.,...&J. M. Liu.(2007).Identification of interfacial and bulk effects in modulating fatigue behaviors of Pb(Zr0.52Ti0.48)O-3 thin films.Journal of Applied Physics,101(1).
MLA Y. Wang,et al."Identification of interfacial and bulk effects in modulating fatigue behaviors of Pb(Zr0.52Ti0.48)O-3 thin films".Journal of Applied Physics 101.1(2007).
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