Defect-induced charge-order melting in thin films of Pr0.5Ca0.5MnO3

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	Defect-induced charge-order melting in thin films of Pr0.5Ca0.5MnO3
	Y. Q. Zhang; Y. L. Zhu; Z. D. Zhang; J. Aarts
	2007
发表期刊	Journal of Applied Physics
ISSN	0021-8979
卷号	101 期号:6
摘要	We have investigated the relation between defect structure and charge order melting in thin films of epitaxial Pr0.5Ca0.5MnO3 (PCMO), grown under strain on SrTiO3. We compared the behavior of an 80 nm film grown in one deposition step at 840 degrees C with the behavior of a film grown in two steps. In the two-step case, a thin PCMO layer of 10 nm was deposited at 120 degrees C, followed by 70 nm deposited at 840 degrees C. The increase of the growth temperature leads to complete crystallization of the first layer and the lattice constants of the two-step grown film indicate that tensile strain is still present. On the other hand, a magnetic field of only 5 T is required to melt the charge-order state in the two-step grown film, which is a much lower than the value for the normally grown film. This appears to be connected to a larger amount of threading dislocations present in the first (recrystallized) layer. (c) 2007 American Institute of Physics.
部门归属	chinese acad sci, inst met res, shenyang natl lab mat sci, shenyang 110016, peoples r china. chinese acad sci, int ctr mat phys, shenyang 110016, peoples r china. leiden univ, kamerlingh onnes lab, nl-2300 ra leiden, netherlands.;zhang, yq (reprint author), chinese acad sci, inst met res, shenyang natl lab mat sci, 72 wenhua rd, shenyang 110016, peoples r china;yqzhang@imr.ac.cn
关键词	Magnetic-field
URL	查看原文
WOS记录号	WOS:000245317700105
引用统计	被引频次：13[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	http://ir.imr.ac.cn/handle/321006/34059
专题	中国科学院金属研究所
推荐引用方式 GB/T 7714	Y. Q. Zhang,Y. L. Zhu,Z. D. Zhang,et al. Defect-induced charge-order melting in thin films of Pr0.5Ca0.5MnO3[J]. Journal of Applied Physics,2007,101(6).
APA	Y. Q. Zhang,Y. L. Zhu,Z. D. Zhang,&J. Aarts.(2007).Defect-induced charge-order melting in thin films of Pr0.5Ca0.5MnO3.Journal of Applied Physics,101(6).
MLA	Y. Q. Zhang,et al."Defect-induced charge-order melting in thin films of Pr0.5Ca0.5MnO3".Journal of Applied Physics 101.6(2007).