Microstructural characterization of layered ternary Ti2AlC

IMR OpenIR

	Microstructural characterization of layered ternary Ti2AlC
	Z. J. Lin; M. J. Zhuo; Y. C. Zhou; M. S. Li; J. Y. Wang
	2006
发表期刊	Acta Materialia
ISSN	1359-6454
卷号	54 期号:4 页码:1009-1015
摘要	Microstructures of Ti2AlC were investigated by means of X-ray diffraction, transmission electron microscopy, and analytical electron microscopy. The as-synthesized Ti2AlC is predominantly single phase and free of amorphous grain-boundary phases. High-resolution imaging reveals that the stacking sequence of Ti and Al atoms along the [0 0 0 1]Ti2AlC direction is A (B) under bar AB (A) under barB. Two intergrown structures, i.e., Ti3AlC2-Ti2AlC and Ti2AlC-TiC-Ti2AlC, were determined using high-resolution imaging and energy dispersive X-ray analysis. Ti3AlC2 and TiC share close crystallographic relationships with Ti2AlC, which opens up the possibility of tuning the properties of Ti-Al-C carbides by controlling the microstructures. Investigation of the microstructure of TiAl-containing Ti2AlC revealed that Ti2AlC preferentially forms at TiAl twins. (c) 2005 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
部门归属	chinese acad sci, met res inst, shenyang natl lab mat sci, high performance ceram iv, shenyang 110016, liaoning, peoples r china. chinese acad sci, grad sch, beijing 100039, peoples r china.;zhou, yc (reprint author), chinese acad sci, met res inst, shenyang natl lab mat sci, high performance ceram iv, 72 wenhua rd, shenyang 110016, liaoning, peoples r china;yczhou@imr.ac.cn
关键词	Hot Pressing Tem Carbides Layered Structures High-temperature Oxidation Liquid Reaction Synthesis In-situ Polycrystalline Ti2alc Electron-microscopy Ti3alc2 Behavior Ceramics Composite Alloys
URL	查看原文
WOS记录号	WOS:000235421300015
引用统计	被引频次：183[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	http://ir.imr.ac.cn/handle/321006/34338
专题	中国科学院金属研究所
推荐引用方式 GB/T 7714	Z. J. Lin,M. J. Zhuo,Y. C. Zhou,et al. Microstructural characterization of layered ternary Ti2AlC[J]. Acta Materialia,2006,54(4):1009-1015.
APA	Z. J. Lin,M. J. Zhuo,Y. C. Zhou,M. S. Li,&J. Y. Wang.(2006).Microstructural characterization of layered ternary Ti2AlC.Acta Materialia,54(4),1009-1015.
MLA	Z. J. Lin,et al."Microstructural characterization of layered ternary Ti2AlC".Acta Materialia 54.4(2006):1009-1015.