Enhanced fatigue-endurance of ferroelectric Pb1-xSrx(Zr0.52Ti0.48)O-3 thin films prepared by sol-gel method

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	Enhanced fatigue-endurance of ferroelectric Pb1-xSrx(Zr0.52Ti0.48)O-3 thin films prepared by sol-gel method
	Y. Wang; Q. Y. Shao; J. M. Liu
	2006
发表期刊	Applied Physics Letters
ISSN	0003-6951
卷号	88 期号:12
摘要	The polarization fatigue behaviors of ferroelectric Pb1-xSrx(Zr0.52Ti0.48)O-3 (PSZT) thin films deposited on Pt-coated silicon wafers are investigated. Significantly enhanced fatigue endurance with increasing Sr doping and decreasing temperature is observed, and the almost fatigue-free performance up to 10(10) switching cycles for PSZT (x=0.2) thin films at room temperature is identified. The dc-conductivity measurements suggest almost 20 times decreasing of the oxygen vacancy density as the Sr doping increases from x=0 to x=0.2. It is believed that the Sr-doping enhances the stability of oxygen ions and suppresses oxygen vacancies, consequently resulting in the improved fatigue endurance. (c) 2006 American Institute of Physics.
部门归属	hong kong polytech univ, dept appl phys, hong kong, hong kong, peoples r china. nanjing univ, nanjing natl lab microstruct, nanjing 210093, peoples r china. chinese acad sci, int ctr mat phys, shenyang, peoples r china.;liu, jm (reprint author), hong kong polytech univ, dept appl phys, hong kong, hong kong, peoples r china;liujm@nju.edu.cn
关键词	Polarization Fatigue Capacitors Memories Srbi2ta2o9 Electrodes Bi4ti3o12 Scenarios Titanate
URL	查看原文
WOS记录号	WOS:000236250100090
引用统计	被引频次：36[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	http://ir.imr.ac.cn/handle/321006/34534
专题	中国科学院金属研究所
推荐引用方式 GB/T 7714	Y. Wang,Q. Y. Shao,J. M. Liu. Enhanced fatigue-endurance of ferroelectric Pb1-xSrx(Zr0.52Ti0.48)O-3 thin films prepared by sol-gel method[J]. Applied Physics Letters,2006,88(12).
APA	Y. Wang,Q. Y. Shao,&J. M. Liu.(2006).Enhanced fatigue-endurance of ferroelectric Pb1-xSrx(Zr0.52Ti0.48)O-3 thin films prepared by sol-gel method.Applied Physics Letters,88(12).
MLA	Y. Wang,et al."Enhanced fatigue-endurance of ferroelectric Pb1-xSrx(Zr0.52Ti0.48)O-3 thin films prepared by sol-gel method".Applied Physics Letters 88.12(2006).