TEM specimen preparation for Al-based amorphous alloys

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	TEM specimen preparation for Al-based amorphous alloys
	H. W. Yang; X. C. Chang; W. L. Hou; J. Q. Wang
	2006
发表期刊	Journal of Materials Science & Technology
ISSN	1005-0302
卷号	22 期号:5 页码:655-658
摘要	Transmission electron microscopy (TEM) is usually used to identify the amorphicity. However, some artifacts may be introduced due to improper TEM foil preparation. In this paper, three Al-rich metallic glasses with and without a glass transition were selected for characterizing the effect of the electropolishing condition on the as-quenched structure during TEM specimen preparation. It is shown that the occurrence of the modulated bright-dark structure under TEM observation is closely sensitive to the electropolishing condition, which suggests us being careful about the possible artifacts induced by specimen preparation when examining amorphous alloys under TEM.
部门归属	chinese acad sci, inst met res, shenyang natl lab mat sci, shenyang 110016, peoples r china.;wang, jq (reprint author), chinese acad sci, inst met res, shenyang natl lab mat sci, shenyang 110016, peoples r china;jqwang@imr.ac.cn
关键词	Al-based Amorphous Alloy Transmission Electron Microscopy Electropolishing Metallic Glasses Primary Crystallization Phase-separation Nanocrystallization Aluminum
URL	查看原文
WOS记录号	WOS:000241099400018
引用统计	被引频次：5[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	http://ir.imr.ac.cn/handle/321006/34639
专题	中国科学院金属研究所
推荐引用方式 GB/T 7714	H. W. Yang,X. C. Chang,W. L. Hou,et al. TEM specimen preparation for Al-based amorphous alloys[J]. Journal of Materials Science & Technology,2006,22(5):655-658.
APA	H. W. Yang,X. C. Chang,W. L. Hou,&J. Q. Wang.(2006).TEM specimen preparation for Al-based amorphous alloys.Journal of Materials Science & Technology,22(5),655-658.
MLA	H. W. Yang,et al."TEM specimen preparation for Al-based amorphous alloys".Journal of Materials Science & Technology 22.5(2006):655-658.