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Phase transition properties of ferroelectric thin films with two surface layers
X. Yang; X. Y. Kuang; C. Lu
2006
发表期刊Solid State Communications
ISSN0038-1098
卷号139期号:8页码:397-402
摘要The phase diagrams of ferroelectric thin films with two surface layers described by the transverse Ising model have been studied under the mean-field approximation. We discuss the effects of the exchange interaction and transverse field parameters on the phase diagrams. The results indicate that the phase transition properties of the phase diagrams can be greatly modified by changing the transverse Ising model parameters. In addition, the crossover features of the parameters from the ferroelectric dominant phase diagram to the paraelectric dominant phase diagram are determined for ferroelectric thin films with two surface layers. (c) 2006 Elsevier Ltd. All rights reserved.
部门归属sichuan univ, inst atom & mol phys, chengdu 610065, peoples r china. acad sinica, int ctr mat phys, shenyang 110016, peoples r china.;kuang, xy (reprint author), sichuan univ, inst atom & mol phys, chengdu 610065, peoples r china;yxxy1224@163.com
关键词Ferroelectrics Thin Films Phase Transitions Transverse Ising-model Diagrams Superlattice
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WOS记录号WOS:000240393900003
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被引频次:14[WOS]   [WOS记录]     [WOS相关记录]
文献类型期刊论文
条目标识符http://ir.imr.ac.cn/handle/321006/34648
专题中国科学院金属研究所
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X. Yang,X. Y. Kuang,C. Lu. Phase transition properties of ferroelectric thin films with two surface layers[J]. Solid State Communications,2006,139(8):397-402.
APA X. Yang,X. Y. Kuang,&C. Lu.(2006).Phase transition properties of ferroelectric thin films with two surface layers.Solid State Communications,139(8),397-402.
MLA X. Yang,et al."Phase transition properties of ferroelectric thin films with two surface layers".Solid State Communications 139.8(2006):397-402.
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