Switching fatigue of ferroelectric layered-perovskite thin films: temperature effect

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	Switching fatigue of ferroelectric layered-perovskite thin films: temperature effect
	G. L. Yuan; J. M. Liu; K. Baba-Kishi; H. L. W. Chan; C. L. Choy; D. Wu
	2005
发表期刊	Materials Science and Engineering B-Solid State Materials for Advanced Technology
ISSN	0921-5107
卷号	118 期号:1-3 页码:225-228
摘要	We study the switching fatigue behaviors of ferroelectric layered-perovskite oxide films, including SrBi2Ta2O9, Bi3.15Nd0.85Ti3O12 and Bi3.25La0.75Ti3O12 deposited on Pt/TiO2/SiO2/Si substrates, at various temperatures. It is found that the damaged ferroelectric polarization and dielectric response in the fatigued films can be easily rejuvenated under a high external electric field, for which the localization of the defect and charge accumulation is argued to be responsible. It is proposed that the probability of fatigue rejuvenation can be characterized by the kinetics of domain wall pinning and depinning which depends on the stability of perovskite-like slabs against defect/charge diffusion and/or the self-regulation of the (Bi2O2)(2), layer to compensate for space charges. (c) 2005 Elsevier B.V. All rights reserved.
部门归属	nanjing univ, solid state microstruct lab, nanjing 210093, peoples r china. hong kong polytech univ, dept appl phys, hong kong, hong kong, peoples r china. chinese acad sci, int ctr mat phys, shenyang, peoples r china.;liu, jm (reprint author), nanjing univ, solid state microstruct lab, nanjing 210093, peoples r china;liujm@niu.edu.cn
关键词	Ferroelectric Thin Films Layered-perovskite Oxides Switching Fatigue Srbi2ta2o9 Interface Mechanism Behavior
URL	查看原文
WOS记录号	WOS:000228514800048
引用统计	被引频次：9[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	http://ir.imr.ac.cn/handle/321006/35190
专题	中国科学院金属研究所
推荐引用方式 GB/T 7714	G. L. Yuan,J. M. Liu,K. Baba-Kishi,et al. Switching fatigue of ferroelectric layered-perovskite thin films: temperature effect[J]. Materials Science and Engineering B-Solid State Materials for Advanced Technology,2005,118(1-3):225-228.
APA	G. L. Yuan,J. M. Liu,K. Baba-Kishi,H. L. W. Chan,C. L. Choy,&D. Wu.(2005).Switching fatigue of ferroelectric layered-perovskite thin films: temperature effect.Materials Science and Engineering B-Solid State Materials for Advanced Technology,118(1-3),225-228.
MLA	G. L. Yuan,et al."Switching fatigue of ferroelectric layered-perovskite thin films: temperature effect".Materials Science and Engineering B-Solid State Materials for Advanced Technology 118.1-3(2005):225-228.