Ultraviolet photovoltage characteristics of SrTiO3-delta/Si heterojunction

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	Ultraviolet photovoltage characteristics of SrTiO3-delta/Si heterojunction
	K. Zhao; Y. H. Huang; Q. L. Zhou; K. J. Jin; H. B. Lu; M. He; B. L. Cheng; Y. L. Zhou; Z. H. Chen; G. Z. Yang
	2005
发表期刊	Applied Physics Letters
ISSN	0003-6951
卷号	86 期号:22
摘要	A photovoltaic effect is observed in the heterostructure of p-Si/n-SrTiO3-delta (p: hole carrier type, n: electron carrier type). The current-voltage curve exhibits a good rectifying characteristic similar to that of the traditional diode. The junction shows the open circuit voltage of 126 mV/mJ, the short circuit current of 1.78 mA/mJ, and the response time faster than 10 ns for ultraviolet pulsed laser of 25 ns in duration at room temperature, suggesting the promising potential of this junction as a new type of ultrafast ultraviolet detectors with high sensitivity for application. (c) 2005 American Institute of Physics.
部门归属	chinese acad sci, inst phys, natl lab condensed matter phys, beijing 100080, peoples r china. liaocheng univ, sch phys sci & informat technol, spintron lab, shandong 252059, peoples r china. chinese acad sci, int ctr mat phys, shenyang 110016, peoples r china.;lu, hb (reprint author), chinese acad sci, inst phys, natl lab condensed matter phys, pob 603, beijing 100080, peoples r china;hblu@aphy.iphy.ac.cn
关键词	Molecular-beam Epitaxy Srtio3 Thin-films Doped Srtio3 Deposition Silicon
URL	查看原文
WOS记录号	WOS:000229590100029
引用统计	被引频次：58[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	http://ir.imr.ac.cn/handle/321006/35265
专题	中国科学院金属研究所
推荐引用方式 GB/T 7714	K. Zhao,Y. H. Huang,Q. L. Zhou,et al. Ultraviolet photovoltage characteristics of SrTiO3-delta/Si heterojunction[J]. Applied Physics Letters,2005,86(22).
APA	K. Zhao.,Y. H. Huang.,Q. L. Zhou.,K. J. Jin.,H. B. Lu.,...&G. Z. Yang.(2005).Ultraviolet photovoltage characteristics of SrTiO3-delta/Si heterojunction.Applied Physics Letters,86(22).
MLA	K. Zhao,et al."Ultraviolet photovoltage characteristics of SrTiO3-delta/Si heterojunction".Applied Physics Letters 86.22(2005).