Microstructural analyses of a highly conductive Nb-doped SrTiO3 film

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	Microstructural analyses of a highly conductive Nb-doped SrTiO3 film
	Y. L. Zhu; X. L. Ma; D. X. Li; H. B. Lu; Z. H. Chen; G. Z. Yang
	2005
发表期刊	Acta Materialia
ISSN	1359-6454
卷号	53 期号:5 页码:1277-1284
摘要	The microstructural characteristics of a highly conductive Nb-doped SrTiO3 thin film grown on (0 0 1) SrTi03 substrate by laser molecular beam epitaxy were extensively studied by means of transmission electron microscopy. It was found that the film was of single-crystal form and epitaxially grown on the SrTi03 substrate forming a flat and distinct interface. Threading dislocations were hardly found within the film and their absence is believed to be the main contributor to the good electrical properties. The Nb-riched nano-agglomerates, which are homogeneously embedded in the film, were found to induce the diffusion interfaces with their surrounding mediums. Pure edge misfit dislocations with Burgers vectors of a<0 1 1> type and line directions of <1 0 0> were found to be the major interfacial defects responsible for the misfit relief. Such dislocations were further dissociated into two equal partial dislocations with Burgers vectors of a/2<0 1 1>. The high conductivity of the film was discussed from the viewpoint of Nb dopant and the lower oxygen pressure. (C) 2004 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
部门归属	chinese acad sci, met res inst, shenyang natl lab mat sci, shenyang 110016, peoples r china. chinese acad sci, inst phys, lab opt phys, beijing 100080, peoples r china. chinese acad sci, ctr condensed matter phys, beijing 100080, peoples r china.;ma, xl (reprint author), chinese acad sci, met res inst, shenyang natl lab mat sci, wenhua rd 72, shenyang 110016, peoples r china;xlma@imr.ac.cn
关键词	Transmission Electron Microscopy Nb-doped Srtio3 Interface Structure High-tc Superconductor Batio3 Thin-films Strontium-titanate Dielectric-properties Single-crystals Dislocations Mobility
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WOS记录号	WOS:000227265100002
引用统计	被引频次：25[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	http://ir.imr.ac.cn/handle/321006/35302
专题	中国科学院金属研究所
推荐引用方式 GB/T 7714	Y. L. Zhu,X. L. Ma,D. X. Li,et al. Microstructural analyses of a highly conductive Nb-doped SrTiO3 film[J]. Acta Materialia,2005,53(5):1277-1284.
APA	Y. L. Zhu,X. L. Ma,D. X. Li,H. B. Lu,Z. H. Chen,&G. Z. Yang.(2005).Microstructural analyses of a highly conductive Nb-doped SrTiO3 film.Acta Materialia,53(5),1277-1284.
MLA	Y. L. Zhu,et al."Microstructural analyses of a highly conductive Nb-doped SrTiO3 film".Acta Materialia 53.5(2005):1277-1284.